Top grid self-alignment thin-film transistor with source/drain areas raised and manufacturing method thereof

A technology of thin film transistor and manufacturing method, which is applied in transistors, semiconductor/solid-state device manufacturing, semiconductor devices and other directions, can solve the problems of increasing off-state current of devices, increasing energy consumption, affecting channel devices, etc., and reducing off-state current. effect, avoid the increase of energy consumption, improve the effect of off-state characteristics

Active Publication Date: 2013-10-09
PEKING UNIV SHENZHEN GRADUATE SCHOOL
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

There are two main problems in bottom-gate thin-film transistors. One is the control of back channel etching (BCE). Etch protection layer (ES) is used to solve this problem, but the use of etch protection layer will increase the complexity of the process
Second, bottom-gate thin film transistors are not easy to achieve self-alignment, and there are compatibility issues between the back exposure technology and the current process, while the traditional manufacturing method will lead to a large overlap area in the bottom-gate thin film transistor, resulting in a large overlap capacitance , is not conducive to reducing the channel size, and

Method used

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  • Top grid self-alignment thin-film transistor with source/drain areas raised and manufacturing method thereof
  • Top grid self-alignment thin-film transistor with source/drain areas raised and manufacturing method thereof
  • Top grid self-alignment thin-film transistor with source/drain areas raised and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0042] Example one:

[0043] The cross-sectional view of the thin film transistor made in this embodiment is as Picture 11 As shown, the thin film transistor is fabricated on a glass substrate 1 and includes an active layer 2, a gate dielectric layer 3, a gate electrode 4, a raised source region 7 and a drain region 8. Among them, the active layer region corresponding to the gate is the channel region, the left and right sides of the channel region are the source region and the drain region, and the elevated parts of the source region and the drain region are above the active layer and are located in the gate dielectric. The left and right sides of the layer. The active layer 2 is located on the glass substrate 1. The active layer includes the channel region corresponding to the gate electrode and the source and drain regions on both sides of the channel region; the gate dielectric layer 3 is located on the active layer 2; the gate electrode 4 is located on the gate dielectric ...

Example Embodiment

[0056] Embodiment two:

[0057] The cross-sectional view of the thin film transistor made in this embodiment is as follows Picture 11 As shown, it is the same as in the first embodiment, as described above.

[0058] The specific examples of the manufacturing process of the thin film transistor in this embodiment are as follows figure 1 — Figure 4 with Picture 8 — Figure 13 Shown. figure 1 — Figure 4 and Picture 12 — Figure 13 The manufacturing method of the method has been detailed in the first embodiment. In this embodiment Picture 8 — Picture 11 The manufacturing process shown is different from that in the first embodiment, which will be described in detail below:

[0059] Such as Picture 8 As shown, a layer of positive photoresist is coated on the surface, and the opaque gate is used as a mask to expose from the back of the glass substrate ( Picture 8 The direction indicated by the middle arrow is the incident direction of the exposure light), and the photoresist 6 on ...

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Abstract

The invention provides a top grid self-alignment thin-film transistor with source/drain areas raised and a manufacturing method of the top grid self-alignment thin-film transistor with the source/drain areas raised. The manufacturing method includes the steps that an oxide semiconductor active layer, a grid dielectric layer and a grid electrode are sequentially formed on glass or a flexible substrate, and the thickness of the oxide semiconductor active layer is 5-20 nanometers in order to reduce influences of short-wavelength light on off-state characteristics of the thin-film transistor; then grid dielectric is corroded with the grid electrode as a stopping layer, the active layer corresponding to the grid dielectric is made to serve as a channel region, the active layers on the two sides are a source area and a drain area respectively, and self-alignment is achieved; next, low-resistivity conductive thin films are deposited, and the raised source area and the raised drain area are formed after photoetching, stripping or corrosion. The thin channels are adopted and the source area and the drain area are raised, not only are the influences of the light on the channels reduced, but also the resistance of the source area and the resistance of the drain area are reduced, and performance of the thin-film transistor is improved.

Description

technical field [0001] The invention relates to a top-gate thin-film transistor and a manufacturing method thereof, in particular to a top-gate self-aligned thin-film transistor with raised source / drain regions, and mainly relates to a method for manufacturing raised source and drain regions. Background technique [0002] Thin film transistors, as switch control elements or integrated elements of peripheral drive circuits, are core devices in flat panel display technology. Currently widely used thin film transistors mainly include amorphous silicon thin film transistors and polysilicon thin film transistors. Amorphous silicon (a-Si) thin film transistors are widely used in driving circuits in flat panel displays or as switch control devices. However, the mobility of amorphous silicon is low, usually below 1cm 2 / V·S, the uniformity of polysilicon is relatively poor, the process is complex and costly, sensitive to visible light, and cannot work under visible light, and it i...

Claims

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Application Information

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IPC IPC(8): H01L21/34H01L21/28H01L29/786
Inventor 张盛东迟世鹏肖祥
Owner PEKING UNIV SHENZHEN GRADUATE SCHOOL
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