A device for direct analysis of solid samples
A technology for analyzing devices and samples, which is applied in the preparation of test samples, measuring devices, analyzing materials, etc., to achieve the effects of controllable spot size, three-dimensional controllable position, and short transmission pipelines
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[0036] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0037] A device for direct analysis of solid samples, including a picosecond laser 1, a laser optical system 2, a sample pool 3, a three-dimensional mobile platform 4, a microscopic imaging system 5, an aerosol transmission system 6, and an inductively coupled plasma mass spectrometer 7, the sample The pool 3 is installed on the three-dimensional mobile platform 4, the microscopic imaging system 5 is aimed at the solid sample in the sample pool 3, the laser beam emitted by the picosecond laser 1 is focused on the sample surface in the sample pool 3 through the laser optical system 2, and is captured by the laser beam. The particles generated after ablation enter into the inductively coupled plasma mass spectrometer 7 through the aerosol transmission system 6 .
[0038] The laser optical system includes an aperture 8, a mirror 9 and a focusing ...
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