A large numerical aperture objective lens wave aberration detection device and method
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
- Publication Date
- 2017-04-05
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a large numerical aperture objective lens wave aberration detection device and method, belonging to the field of optical detection.
[0002] technical background
[0003] With the improvement of the resolution of the objective optical system, higher requirements are put forward for the aberration in the measurement and correction system. The traditional geometric aberration, optical transfer function and point spread function can no longer meet the aberration description of the high-resolution objective optical system. Wave aberration has become a more stringent evaluation method for evaluating the imaging quality of high-resolution objective optical systems. According to the resolution formula R=k 1 It can be seen from λ / NA that the high-resolution objective lens will develop in the direction of increasing numerical aperture (NA). For a large numerical aperture objective lens with a magnification of less than 1, the image-sid...