Epitaxial wafer of GaN-based light-emitting diode and preparing method thereof
A technology of light-emitting diodes and epitaxial wafers, applied in electrical components, circuits, semiconductor devices, etc., can solve problems such as affecting the thermal stability of the device, reducing the crystal integrity, etc., to achieve good thermal stability of the device, improve service life, and good current. extended effect
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Embodiment 1
[0034] An embodiment of the present invention provides an epitaxial wafer of a GaN-based light emitting diode, see figure 1 , the epitaxial wafer includes a substrate 1, a buffer layer 2 grown on the substrate 1, an N-type layer 3, a multi-quantum well layer 5 and a P-type layer 6, and the epitaxial wafer also includes a layer grown on the N-type layer 3 and the multi-quantum well The N-type current spreading layer 4 between the layers 5, the N-type current spreading layer 4 is a GaN layer grown by delta doping technology, the doping concentration of the N-type current spreading layer 4 is lower than the doping concentration of the N-type layer 3, Starting from the N-type layer 3 side, the doping concentration of the N-type current spreading layer 4 remains constant or the doping concentration of the N-type current spreading layer 4 gradually decreases, and the N-type current spreading layer adjacent to the multi-quantum well layer 5 side The doping concentration of layer 4 is...
Embodiment 2
[0044] An embodiment of the present invention provides a method for preparing a GaN-based light-emitting diode, see figure 2 , the method includes:
[0045] Step 201: Provide a substrate.
[0046] Specifically, the substrate may be a sapphire substrate, and may also be a Si substrate or a SiC substrate.
[0047] Step 202: growing a buffer layer on the substrate.
[0048] Wherein, the buffer layer may be a composite layer, which may include a low-temperature buffer layer and an undoped GaN layer. Specifically, at a temperature of 540° C., a GaN layer with a thickness of 30 nm is grown on the substrate as a low-temperature buffer layer. Then the temperature is raised to about 1100°C, and a layer of undoped GaN layer with a thickness of about 3 μm is grown on the low-temperature buffer layer.
[0049] It is easy to know that before this step, the method may further include: cleaning the surface of the substrate. When it is realized, the sapphire substrate can be heated to 1...
Embodiment 3
[0077] The embodiment of the present invention provides a method for preparing a GaN-based light-emitting diode. The method for preparing the epitaxial wafer in this embodiment is basically the same as that in Embodiment 2, except that, starting from the side of the N-type layer, the N-type current expands The doping concentration of the layers decreases gradually.
[0078] Wherein, starting from the side of the N-type layer, the doping concentration of the N-type current spreading layer may decrease uniformly or irregularly. When it is realized, the time for feeding the doped impurity source can be uniformly or irregularly shortened each time without changing the flow rate of the impurity source, so as to gradually reduce the doping concentration of the N-type current spreading layer, and also Under the condition of not changing the time of feeding the impurity source each time, the flow rate of the impurity source can be reduced uniformly or irregularly, so as to gradually r...
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