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A nanoporous cdzno film with adjustable surface morphology and its preparation method

A surface morphology and nanoporous technology, applied in the direction of nanotechnology, nanotechnology, nanotechnology, etc. for materials and surface science, can solve problems such as contamination, high price, and increased material preparation costs, and achieve low cost, The effect of increasing output and yield, facilitating large-area preparation and batch production

Active Publication Date: 2017-01-04
AVIC BEIJING INST OF AERONAUTICAL MATERIALS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this method often requires the introduction of expensive and complex preparation templates to assist, which increases the preparation cost of the material on the one hand, and easily introduces other impurities to cause contamination on the other hand.

Method used

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  • A nanoporous cdzno film with adjustable surface morphology and its preparation method
  • A nanoporous cdzno film with adjustable surface morphology and its preparation method
  • A nanoporous cdzno film with adjustable surface morphology and its preparation method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0022] 1) Select the silicon wafer cleaned by the standard RCA process, put it into the reaction chamber of the radio frequency reaction magnetron sputtering device, and the vacuum degree of the reaction chamber is pumped to 1×10 -3 Pa.

[0023] 2) A CdZnO ceramic target with a Cd molar doping amount of 10% was selected as a sputtering source, and a CdZnO film with a thickness of about 50 nm was deposited by radio frequency reactive magnetron sputtering, and the substrate temperature was 300°C.

[0024] 3) Heat-treat the deposited CdZnO film at 600° C. for 1 hour in the air, and then take it out and cool it naturally to obtain a CdZnO film with a nanoporous structure.

[0025] figure 1 It is the SEM image of the nanoporous CdZnO thin film prepared through the above steps. It can be seen from the figure that the film has been fully crystallized, and the surface is covered with "gully"-shaped holes, and the average width of the holes is about tens of nanometers. After analysi...

Embodiment 2

[0027] 1) Select the silicon wafer cleaned by the standard RCA process, put it into the reaction chamber of the radio frequency reaction magnetron sputtering device, and the vacuum degree of the reaction chamber is pumped to 1×10 -3 Pa.

[0028] 2) A CdZnO ceramic target with a Cd molar doping amount of 20% was selected as the sputtering source, and a CdZnO film with a thickness of about 500 nm was deposited by radio frequency reactive magnetron sputtering, and the substrate temperature was 300 °C.

[0029] 3) heat-treat the deposited CdZnO film at 800° C. for 1 hour in the air, and then take it out and cool it naturally to obtain a CdZnO film with a nanoporous structure.

[0030] figure 2 It is the SEM image of the nanoporous CdZnO thin film prepared through the above steps. It can be seen from the figure that the film has been fully crystallized, and the surface is covered with "gully"-shaped holes. The average width of the holes is several hundred nanometers, and they ar...

Embodiment 3

[0032] 1) Select the silicon wafer cleaned by the standard RCA process, put it into the reaction chamber of the radio frequency reaction magnetron sputtering device, and the vacuum degree of the reaction chamber is pumped to 1×10 -3 Pa.

[0033] 2) A CdZnO ceramic target with a Cd molar doping amount of 30% was selected as the sputtering source, and a CdZnO film with a thickness of about 2 μm was deposited by radio frequency reactive magnetron sputtering, and the substrate temperature was 300 °C.

[0034] 3) heat-treat the deposited CdZnO film at 1100° C. for 1 hour in the air, and then take it out and cool it naturally to obtain a CdZnO film with a nanoporous structure.

[0035] image 3 It is the SEM image of the nanoporous CdZnO thin film prepared through the above steps. It can be seen from the figure that the film has been fully crystallized, and the surface is covered with "gully"-shaped holes. The average width of the holes is on the order of microns, and they are int...

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Abstract

The invention relates to the fields of semiconductor nano-energy materials, catalytic materials, sensing materials, photoelectric conversion materials, etc., and specifically relates to a photoanode, reaction catalytic carrier, sensitive medium of sensing and detection devices, visible electroluminescent A nanoporous CdZnO film with adjustable surface morphology and a preparation method thereof in the field of active layers of light-emitting devices and the like. In the invention, a CdZnO ceramic target is used to form a film by sputtering deposition on a substrate, and then the deposited film is subjected to high-temperature annealing treatment to prepare nanoporous CdZnO films with different surface structures. By adjusting the Cd doping amount in the target, the surface porous morphology of the film can be adjusted, and the average width of the pores can be adjusted from tens of nanometers to microns. The method does not need the assistance of a template, the operation is simple and controllable, and there is no special requirement on the shape and material of the substrate, which provides a new technology for CdZnO nanoporous film material with low cost, short cycle time and industrial implementation.

Description

technical field [0001] The invention relates to the fields of semiconductor nano-energy materials, catalytic materials, sensing materials, photoelectric conversion materials, etc., and specifically relates to a photoanode, a reaction catalytic carrier, a sensitive medium of a sensing and detection device, and a visible electroluminescence device applicable to a dye-sensitized solar cell. A nanoporous CdZnO film with adjustable surface morphology and a preparation method thereof in the field of active layers of light-emitting devices and the like. Background technique [0002] ZnO thin film material is an important direct wide bandgap semiconductor material. Due to its abundant raw materials, low cost, and high room temperature exciton binding energy, it is considered to be a new generation of photoelectric conversion materials that may replace gallium nitride (GaN). At the same time, ZnO-based thin film materials have excellent piezoelectric, gas-sensitive, and photosensiti...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C23C14/35C23C14/08C23C14/58B82Y40/00B82Y30/00
Inventor 田野刘大博罗飞成波刘勇
Owner AVIC BEIJING INST OF AERONAUTICAL MATERIALS