Light emitting element and method of manufacturing same
A light-emitting element and manufacturing method technology, applied in the direction of electrical components, laser components, lasers, etc., can solve the problems of easy increase in contact resistance, no mention of the second conductive layer, etc., to suppress interference, achieve uniformity, suppress Effect of Thickness Variation
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Embodiment 1
[0032] 2. Embodiment 1 (Light-emitting element manufacturing method according to the first embodiment of the disclosure)
Embodiment 2
[0033] 3. Embodiment 2 (light-emitting element manufacturing method according to the second embodiment of the disclosure, light-emitting element of the disclosure)
[0034] 4. Example 3 (Modifications of Example 1 and Example 2), Other General Explanations Related to Manufacturing Methods of Light-Emitting Elements According to First and Second Embodiments of the Disclosure and Light-Emitting Elements of the Disclosure
[0035] In the light-emitting element manufacturing method according to the first embodiment or the second embodiment of the disclosure, the first surface of the first compound semiconductor layer and the first surface of the first compound semiconductor layer and the second A light reflective layer or protrusions are exposed. First, the removal of the substrate used to manufacture the light-emitting element is performed by using an alkaline aqueous solution (such as an aqueous potassium hydroxide solution or an aqueous sodium hydroxide solution, an ammonia sol...
Embodiment 3
[0138] As described above, when the first compound semiconductor layer 21 is formed by performing horizontal growth using a method in which epitaxial growth is performed in the horizontal direction, such as an epitaxial lateral overgrowth (ELO) method, the first light reflection layer is formed thereon. 41 or convex portion 51 on the substrate used to manufacture the light-emitting element 11, if the first light reflecting layer 41 or the edge portion of the convex portion 51 is epitaxially grown toward the center portion of the first light reflecting layer 41 or the convex portion 51 When the compound semiconductor layers 21 meet, a large number of crystal defects occur at the meeting portion.
[0139] In the light-emitting element of Example 3 or in the manufacturing method of the light-emitting element of Example 3, the centroid of the second light reflective layer 42 is not at the point passing through the centroid of the first light reflective layer 41 relative to the firs...
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