Preparation method of sulfur and silver co-doped p-type zinc oxide photoelectric thin film
An optoelectronic thin film and co-doping technology, which is applied in the manufacturing of circuits, electrical components, semiconductor/solid-state devices, etc., can solve the problems of difficult realization of p-type ZnO thin films, hindering shallow acceptor levels, and no further research, etc. Large-scale industrial production, high repeatability, and the effect of reducing production cost consumption
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Embodiment 1
[0019] (1) Use the silicon after the surface has been strictly cleaned as the substrate, put it into the sample 1 position, heat the substrate to 300°C, and pump the vacuum degree of the magnetron sputtering chamber to 10 -4 After the order of Pa, control the parameters of the argon flowmeter to 80sccm, (the air pressure is stable at 4.1-4.3Pa), set the RF power of the zinc sulfide target to 80W, and the DC sputtering power of the silver target to 10W, and obtain Ag doping by sputtering A ZnS:Ag film with a ratio of 3.9%.
[0020] (2) The obtained ZnS:Ag thin film was subjected to thermal oxidation treatment in an oxygen atmosphere at a temperature of 800° C. for 6 hours. A p-type ZnO film co-doped with sulfur and zinc with a thickness of about 985 nm was obtained.
[0021] The room temperature electrical properties of the obtained p-type ZnO film co-doped with sulfur and zinc are shown in Table 1, the resistivity is 0.0389Ωcm, and the mobility is 7.85cm 2 / V·s, the carrier...
Embodiment 2
[0024] (1) Put the strictly cleaned quartz as the substrate, put it into the sample 2 position, set the substrate temperature to 250°C; pump the vacuum degree of the magnetron sputtering chamber to 10 -4 After the Pa order of magnitude, control the parameters of the argon gas flowmeter to 50sccm, (the air pressure is stable at 3.-3.3Pa), set the RF power of the zinc sulfide target to 50W, and the DC sputtering power of the silver target to 5W, and the Ag-doped A ZnS:Ag thin film with a dopant ratio of 2.9%.
[0025] (2) The obtained ZnS:Ag thin film was subjected to thermal oxidation treatment in an oxygen atmosphere at a temperature of 1000° C. for 8 hours. A p-type ZnO film co-doped with sulfur and zinc with a thickness of about 818 nm was obtained.
[0026] The room temperature electrical properties of the obtained p-type ZnO film co-doped with sulfur and zinc are shown in Table 2, the resistivity is 0.054Ωcm, and the mobility is 20.78cm 2 / V·s, the carrier concentration...
Embodiment 3
[0029] (1) Put the silicon that has been strictly cleaned on the surface as the substrate, put it into the sample 2 position, and set the substrate temperature to 350°C; pump the vacuum degree of the magnetron sputtering chamber to 10 -4 After the Pa order of magnitude, control the parameters of the argon gas flowmeter to 100sccm, (the air pressure is stable at 4.8.-5.0Pa), set the RF power of the zinc sulfide target to 100W, and the DC sputtering power of the silver target to 20W, and the Ag-doped A ZnS:Ag thin film with a dopant ratio of 7.2%.
[0030] (2) The obtained ZnS:Ag thin film was subjected to thermal oxidation treatment in an oxygen atmosphere at a temperature of 600° C. for 8 hours. A p-type ZnO film co-doped with sulfur and zinc with a thickness of about 1132 nm was obtained.
[0031] The room temperature electrical properties of the obtained p-type ZnO film co-doped with sulfur and zinc are shown in Table 3, the resistivity is 0.054Ωcm, and the mobility is 0.0...
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