Labview-based semiconductor laser chip testing system

Abstract

The present invention discloses a testing system, especially a labview-based semiconductor laser chip testing system. The system comprises a computer, a spectrometer, a four-axis motor controller, a four-axis motor, an analog voltage output module, a voltage-to-current module, a multi-channel analog signal data collection module, a temperature control feedback circuits, an X / Y / Z three-dimensional motion platform, a T-axis one-dimensional translation stage, a vacuumizing chip bar adsorption stage, a laser power detector, a three-dimensional optical fiber coupling adjustment stage, a CCD camera monitoring system, a three-dimensional chip probe fixing adjustment frame, and a universal serial bus (USB). According to the testing system, the time for testing each single chip is as short as possible, and the production efficiency is greatly improved. In this way, the system is adapted to meet the requirement of the modern batch production. Meanwhile, the system can be applied to different types of surface-launching semiconductor lasers and meet the requirements of different performance tests. The repeated development work is reduced. The system is high in testing precision and good in repeatability, and the influence of manual factors is reduced as much as possible. At the same time, concerned procedure parameters can also be tested, thereby improving the coverage rate.

Description

technical field [0001] The invention discloses a test system, in particular to a test system of a semiconductor laser chip based on labview. Background technique [0002] Semiconductor lasers, also known as laser diodes, are lasers that use semiconductor materials as working substances. Due to the difference in material structure, the specific process of different types of lasers is quite special. Commonly used working substances are gallium arsenide (GaAs), cadmium sulfide (CdS), indium phosphide (InP), zinc sulfide (ZnS), etc. There are three types of excitation methods: electrical injection, electron beam excitation, and optical pumping. At present, semiconductor lasers have very important applications in various fields. Industrialized mass production has put forward higher requirements for the testing speed and performance analysis of laser chips. At present, the test system imported from abroad is generally used in China, but it is expensive, and there is no way to im...

AI Technical Summary

Problems solved by technology

At present, the test system imported from abroad is generally used in China, but it is expensive, and there is no way to improve it according to the needs, whether it is hardware or software, and it cannot meet the production test requirements of different types of laser chips; poor efficiency

Images