Proton heavy ion-beam-flow vertical beam bunch shape measurement detector

A heavy ion beam and detector technology, applied in the field of proton heavy ion beam longitudinal beam shape measurement detectors, can solve the problems of inaccurate longitudinal beam length measurement by BPM, inaccurate longitudinal beam length measurement, complex structure, etc. , to achieve the effect of improving anti-interference ability, improving time resolution and simple system
CN106501840AActive Publication Date: 2017-03-15INST OF MODERN PHYSICS CHINESE ACADEMY OF SCI
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Patent Information

Authority / Receiving Office
CN ยท China
Patent Type
Applications(China)
Current Assignee / Owner
INST OF MODERN PHYSICS CHINESE ACADEMY OF SCI
Publication Date
2017-03-15

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Abstract

The invention relates to the accelerator beam flow diagnosis, beam flow measurement, and vertical beam bunch shape measurement field and especially relates to a proton heavy ion-beam-flow vertical beam bunch shape measurement detector. The detector comprises a detector main body and a microwave band shape line structure arranged on the detector main body. The detector main body comprises a flange. A tantalum copper composite board is connected to the flange through a support frame. A water cooling pipe is arranged between the flange and the tantalum copper composite board. The microwave band shape line structure is arranged on an inner side of the tantalum copper composite board. The microwave band shape line structure is fixed to a microwave band shape line bottom plate. Adaptors are arranged above and below the microwave band shape line structure respectively. The microwave band shape line structure comprises a medium substrate. Upper layer ground and lower layer ground are arranged above and below the medium substrate respectively. The medium substrate is provided with a positioning hole, a first metallization through hole and a second metallization through hole. A band shape line conduction band and a microstrip line conduction band are arranged on the medium substrate. The structure is compact, processing and operation control are easy to achieve, time resolution is high and anti-interference performance is high.
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Description

technical field

[0001] The invention relates to the technical fields of accelerator beam current diagnosis, beam current measurement and longitudinal cluster shape measurement, in particular to a proton heavy ion beam longitudinal cluster shape measurement detector. Background technique

[0002] As the eyes of the accelerator, the beam diagnosis system is one of its important systems. The beam transmission and the determination of the performance and parameters of the accelerator are monitored through the measurement of the beam parameters by the beam diagnosis system. Necessary means of matching. Accelerator laboratories both at home and abroad attach great importance to the beam current testing system and its application research. Among them, the shape of the longitudinal bunch is one of the important parameters to measure the quality of the beam. Through the measurement of the length of the longitudinal bunch, the longitudinal emissivity of the beam can be calculated, th...

Claims

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