Low-pressure oxidization process for crystalline silicon small-textured structure
An oxidation process, crystalline silicon technology, applied in semiconductor devices, sustainable manufacturing/processing, photovoltaic power generation, etc., can solve the problems of large influence of anti-reflection film deposition process, high doping concentration of diffusion surface, affecting the appearance quality of cells, etc. , to solve the problem of surface passivation, solve the problem of high doping concentration, and improve the quality of battery products
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Embodiment 1
[0019] A low-pressure oxidation process for crystalline silicon small textured structure, comprising the following steps:
[0020] Step 1: Entering the boat: Continuously inject nitrogen gas with a flow rate of 1500 sccm into the furnace tube of the low-pressure diffusion furnace, and at the same time insert the etched and cleaned silicon wafer into the quartz boat and send it into the furnace tube; the surface of the silicon wafer has a small textured texture The surface size is 0.5 μm.
[0021] Step 2: Heating up: stop feeding nitrogen, raise the temperature to 600° C., and control the gas pressure in the furnace tube to 60 mbar.
[0022] Step 3: Leak detection and pressure maintenance: Detect the gas pressure in the furnace tube, control the temperature in the furnace tube at 600°C, the gas pressure at 60mbar, and the pressure holding time for 2 minutes.
[0023] Step 4: Oxidation: Introduce oxygen at a flow rate of 1000 sccm into the furnace tube for 5 minutes, control th...
Embodiment 2
[0027] A low-pressure oxidation process for crystalline silicon small textured structure, comprising the following steps:
[0028] Step 1: Entering the boat: Continuously inject nitrogen gas with a flow rate of 1500 sccm into the furnace tube of the low-pressure diffusion furnace, and at the same time insert the etched and cleaned silicon wafer into the quartz boat and send it into the furnace tube; the surface of the silicon wafer has a small textured texture The surface size is 0.5 μm.
[0029] Step 2: Heating up: stop feeding nitrogen, raise the temperature to 600° C., and control the gas pressure in the furnace tube to 50 mbar.
[0030] Step 3: Leak detection and pressure maintenance: Detect the gas pressure in the furnace tube, control the temperature in the furnace tube at 600°C, the gas pressure at 65mbar, and the pressure holding time for 1.5min.
[0031] Step 4: Oxidation: Introduce oxygen at a flow rate of 1000 sccm into the furnace tube for 9 minutes, control the t...
Embodiment 3
[0035] A low-pressure oxidation process for crystalline silicon small textured structure, comprising the following steps:
[0036] Step 1: Entering the boat: Continuously inject nitrogen gas with a flow rate of 2500 sccm into the furnace tube of the low-pressure diffusion furnace, and at the same time insert the etched and cleaned silicon wafer into the quartz boat and send it into the furnace tube; the surface of the silicon wafer has a small textured texture The surface size is 1 μm.
[0037] Step 2: Heating up: stop feeding nitrogen, raise the temperature to 700° C., and control the gas pressure in the furnace tube to 80 mbar.
[0038] Step 3: Leak detection and pressure maintenance: Detect the gas pressure in the furnace tube, control the temperature in the furnace tube at 700°C, the gas pressure at 100mbar, and the pressure holding time for 2.5 minutes.
[0039] Step 4: Oxidation: Introduce oxygen at a flow rate of 1500 sccm into the furnace tube for 30 minutes, control ...
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