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Low-pressure oxidization process for crystalline silicon small-textured structure

An oxidation process, crystalline silicon technology, applied in semiconductor devices, sustainable manufacturing/processing, photovoltaic power generation, etc., can solve the problems of large influence of anti-reflection film deposition process, high doping concentration of diffusion surface, affecting the appearance quality of cells, etc. , to solve the problem of surface passivation, solve the problem of high doping concentration, and improve the quality of battery products

Inactive Publication Date: 2018-02-09
CECEP SOLAR ENERGY TECH (ZHENJIANG) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the size of the textured surface decreases from the micron level to the quasi-micron level, it has a great impact on the solar cell diffusion process and the anti-reflection film deposition process, which is likely to cause problems such as high doping concentration on the diffusion surface and poor passivation effect.
Some people try to solve this problem by adding a traditional thermal oxidation process before the anti-reflection film deposition process. However, the traditional thermal oxidation process will cause problems such as uneven resistance after oxidation, poor passivation effect, and easy to produce white spots and other poor appearance. Affect the appearance quality of the cell

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0019] A low-pressure oxidation process for crystalline silicon small textured structure, comprising the following steps:

[0020] Step 1: Entering the boat: Continuously inject nitrogen gas with a flow rate of 1500 sccm into the furnace tube of the low-pressure diffusion furnace, and at the same time insert the etched and cleaned silicon wafer into the quartz boat and send it into the furnace tube; the surface of the silicon wafer has a small textured texture The surface size is 0.5 μm.

[0021] Step 2: Heating up: stop feeding nitrogen, raise the temperature to 600° C., and control the gas pressure in the furnace tube to 60 mbar.

[0022] Step 3: Leak detection and pressure maintenance: Detect the gas pressure in the furnace tube, control the temperature in the furnace tube at 600°C, the gas pressure at 60mbar, and the pressure holding time for 2 minutes.

[0023] Step 4: Oxidation: Introduce oxygen at a flow rate of 1000 sccm into the furnace tube for 5 minutes, control th...

Embodiment 2

[0027] A low-pressure oxidation process for crystalline silicon small textured structure, comprising the following steps:

[0028] Step 1: Entering the boat: Continuously inject nitrogen gas with a flow rate of 1500 sccm into the furnace tube of the low-pressure diffusion furnace, and at the same time insert the etched and cleaned silicon wafer into the quartz boat and send it into the furnace tube; the surface of the silicon wafer has a small textured texture The surface size is 0.5 μm.

[0029] Step 2: Heating up: stop feeding nitrogen, raise the temperature to 600° C., and control the gas pressure in the furnace tube to 50 mbar.

[0030] Step 3: Leak detection and pressure maintenance: Detect the gas pressure in the furnace tube, control the temperature in the furnace tube at 600°C, the gas pressure at 65mbar, and the pressure holding time for 1.5min.

[0031] Step 4: Oxidation: Introduce oxygen at a flow rate of 1000 sccm into the furnace tube for 9 minutes, control the t...

Embodiment 3

[0035] A low-pressure oxidation process for crystalline silicon small textured structure, comprising the following steps:

[0036] Step 1: Entering the boat: Continuously inject nitrogen gas with a flow rate of 2500 sccm into the furnace tube of the low-pressure diffusion furnace, and at the same time insert the etched and cleaned silicon wafer into the quartz boat and send it into the furnace tube; the surface of the silicon wafer has a small textured texture The surface size is 1 μm.

[0037] Step 2: Heating up: stop feeding nitrogen, raise the temperature to 700° C., and control the gas pressure in the furnace tube to 80 mbar.

[0038] Step 3: Leak detection and pressure maintenance: Detect the gas pressure in the furnace tube, control the temperature in the furnace tube at 700°C, the gas pressure at 100mbar, and the pressure holding time for 2.5 minutes.

[0039] Step 4: Oxidation: Introduce oxygen at a flow rate of 1500 sccm into the furnace tube for 30 minutes, control ...

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Abstract

The invention discloses a low-pressure oxidization process for a crystalline silicon small-textured structure. The low-pressure oxidization process is carried out on a crystalline silicon wafer with the textured dimension of 0.1-2[mu]m to generate a layer of uniform SiO<2> layer on the surface of the crystalline silicon small-textured structure, so that the surface recombination rate is lowered, the minority carrier lifetime is prolonged, the problem of surface passivation of the crystalline silicon small-textured structure is solved, the surface doping concentration of an emitter can be lowered, the problem of overhigh surface doping concentration of the small-textured structure can be solved, the influence from "dead layer" can be weakened obviously, and the short-wave response of the battery can be improved; meanwhile, the oxidization process is performed in a low-pressure state, so that gas stability and uniformity and environment cleanliness in a diffusion furnace tube can be improved, the sheet resistance uniformity after oxidization is greatly improved and the battery efficiency is improved; and meanwhile, the problem of abnormal appearance of the silicon wafer surface in normal-pressure oxidization can be solved, the number of the abnormal white spots and the like on the silicon wafer surface can be obviously reduced, and the battery product quality is improved effectively.

Description

technical field [0001] The invention relates to the field of crystalline silicon batteries, in particular to a crystalline silicon texturing process. Background technique [0002] High-efficiency, low-cost crystalline silicon cells are the mainstream direction of the photovoltaic market in the future, and how to avoid optical and electrical losses as much as possible are two core issues of research concern. [0003] Light trapping technology is an important means to solve optical loss and improve the utilization rate of solar spectrum. In order to improve the light trapping effect on the surface of crystalline silicon cells and enhance the absorption of light, small textured structures are increasingly used in crystalline silicon cells. However, since the size of the textured surface decreases from the micron level to the quasi-micron level, it has a great impact on the solar cell diffusion process and the anti-reflection film deposition process, which is likely to cause pr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/18H01L31/068
CPCH01L31/068H01L31/1804H01L31/1868Y02E10/547Y02P70/50
Inventor 黄惜惜周肃黄钧林贾佳余静文黄青松勾宪芳
Owner CECEP SOLAR ENERGY TECH (ZHENJIANG) CO LTD
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