Method and device for high-throughput characterization of heat and structure in process of crystal material melting and solidification
A technique for crystalline materials, melting processes, used in measuring devices, thermal development of materials, analyzing materials, etc.
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Embodiment 1
[0043] In this example, see figure 1 with figure 2 , a crystal melting-solidification high-throughput test and analysis device, mainly including two heating furnaces 2, a sample carrying device 3, a stage linkage device 4, an X-ray imaging device unit, an X-ray diffraction test device unit, a differential Composed of scanning calorimeter unit and main controller;
[0044] In the closed cavity of one of the heating furnaces 2, the sample carrying device 3 is set, and the AlSi 12 The crystal material to be tested is set on the sample carrying device 3, and the main controller can control the stage linkage device 4 to pull the sample carrying device 3 to rotate horizontally, thereby adjusting the AlSi on the sample carrying device 3. 12 The rotation angle of the crystal material to be measured; a reference object carrying device 6 is set in the closed inner cavity of another heating furnace 2, and an inert reference object is arranged on the reference object carrying device 6; t...
Embodiment 2
[0063] This embodiment is basically the same as Embodiment 1, especially in that:
[0064] In this embodiment, the main controller can also control the stage linkage device 4 to pull the sample carrying device 3 to perform a compound movement of horizontal rotation, horizontal displacement and lifting displacement, so that the crystal to be measured arranged on the sample carrying device 3 The material undergoes a spatial displacement transformation of the X, Y, and Z axes. The heating element for heating is made of iron-chromium-aluminum alloy; the heating resistance wire of the independent heating device 8 is made of iron-chromium-aluminum alloy; when the X-ray light source 1 performs X-ray irradiation, a transmission target and a reflection target are used, and the target material is tungsten; The protective gas used in the inert gas atmosphere in the heating furnace 2 is argon. The sample carrying device 3 can precisely rotate 360°, and the minimum rotation angle is less ...
Embodiment 3
[0067] This embodiment is basically the same as the previous embodiment, and the special features are:
[0068] In this embodiment, the relative position of the heating furnace 2 and the X-ray light source 1 is adjusted so that the distance between the heating furnace 2 and the X-ray light source 1 is the minimum value, so that the X-ray spot reaches a set small size, and the set High-resolution 2D or 3D tissue images. In this embodiment, when the stage linkage device 4 is operated, the distance between the furnace body device of the heating furnace 2 and the X-ray light source 1 is the minimum value, so that the X-ray light source 1 spot is smaller, and a higher resolution can be obtained. High 3D images. In this embodiment, differential scanning calorimetry is used to characterize the heat change during the crystal melting-solidification process in real time, and X-ray diffraction is used to analyze the structural information of the process in real time. During the crystal ...
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