Terahertz emission source based on transition metal chalcogenide and excitation method
A technology of chalcogenides and transition metals, applied in the field of terahertz band devices, can solve the problems of inability to effectively radiate elliptically polarized terahertz waves, terahertz signal noise, etc., to improve mobility and nonlinear coefficient, and stabilize lattice structure, the effect of improving the modulation efficiency
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Embodiment 1
[0045] Such as figure 1 As shown, the terahertz emission source of this embodiment includes a quartz substrate 1 and a tungsten disulfide crystal thin film layer 2, the thickness of the thin film layer is 100nm, a femtosecond laser with a frequency of 800nm, a pulse width of 60fs, and a repetition rate of 1KHz is used as the pumping light source 3. In this embodiment, the pump power is 0.42~2.00mJ / cm 2 ,, the femtosecond laser pulse pumps and excites the surface of the radiation device at a 45° oblique incidence, and detects the terahertz wave radiation at the 45° reflective surface. Using zinc telluride as the detection crystal to detect terahertz waves on the 45° reflective surface, the results are as follows Figure 4 (a) shown.
[0046] The signal-to-noise ratio of the terahertz wave radiation obtained in this example is -18.4--37.4dB in the range of 0.58-2.5THz, and the electron mobility is 50-150cm 2 V -1 S -1 , The radiation electric field strength is 0.22-0.51kV / c...
Embodiment 2
[0048] Such as figure 2 As shown, the terahertz emission source of this embodiment includes a quartz substrate 1 and a tungsten disulfide thin film layer 2, the thickness of the thin film layer is 0.72nm, and a femtosecond laser with a frequency of 800nm, a pulse width of 60fs, and a repetition rate of 1KHz is used as the pumping light source 3. Among them, the pump power is 4.53~6.51mJ / cm 2 . The femtosecond laser pulse is incident at 45° obliquely to pump and excite the surface of the radiation device, and detect the terahertz wave radiation at 45° in the transmission path, and detect the terahertz wave radiation on the 45° transmission surface, the results are as follows Figure 4 (b) shown.
[0049] The signal-to-noise ratio of the terahertz wave radiation obtained in this example is -17.6--34.9dB in the range of 0.58-2.5THz, and the electron mobility is 150-200cm 2 V -1 S -1 , The radiation electric field strength is 0.11 ~ 0.26kV / cm.
Embodiment 3
[0051] The difference between this embodiment and embodiment 2 lies in that the thickness of the film layer is 8nm. It is found that the film layer in this embodiment can radiate elliptically polarized terahertz waves.
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