A 4h-sic ultraviolet detector with high responsivity and low dark current pin structure and preparation method thereof
A UV detector and responsivity technology, applied in circuits, electrical components, semiconductor devices, etc., can solve the problems of low responsivity, high dark current, poor long-term reliability, etc., and achieve the effect of improving responsivity and low dark current
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[0034] like figure 2 As shown, the 4H-SiC ultraviolet detector with high responsivity and low dark current PIN structure, the device is prepared on the n-type 4H-SiC substrate material, including from bottom to top: the lower metal contact electrode (n-type contact electrode ) 101, n-type 4H-SiC conductive substrate 102, n-type 4H-SiC ohmic contact layer 103, i-type 4H-SiC photon absorption layer 104, p-type 4H-SiC ohmic contact layer 105, oxygen plasma treatment of p-type 4H - SiC contact layer 108 , Ti / Al / Ti / Au alloyed p-type upper metal contact electrode 107 , passivation protection layer 106 . The mesa structure is a vertical mesa structure, and the mesa needs to be etched from the p-type 4H-SiC contact layer 105 on the surface to the n-type 4H-SiC ohmic contact layer 103 , and its bottom is on the n-type 4H-SiC conductive substrate 102 .
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