Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A time-to-analog conversion circuit and single-photon time-of-flight measurement method

An analog conversion and circuit technology, which is applied in the direction of electrical unknown time interval measurement, time interval measurement device, and measurement circuit, can solve the problems of short time measurement range and small distance, and achieve good time resolution, high yield, and The effect of facilitating large-scale integration

Active Publication Date: 2020-10-02
NANJING UNIV OF POSTS & TELECOMM
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the time measurement range of traditional TAC circuits is short, usually from a few nanoseconds to tens of nanoseconds, so the distance that can be measured is small

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A time-to-analog conversion circuit and single-photon time-of-flight measurement method
  • A time-to-analog conversion circuit and single-photon time-of-flight measurement method
  • A time-to-analog conversion circuit and single-photon time-of-flight measurement method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0021] Such as figure 1 Shown is the circuit diagram of the time-to-analog conversion circuit of the present invention. It includes a signal input logic unit, a timing unit, a voltage holding unit and a readout unit.

[0022] The signal input logic unit includes an OR gate and an RS flip-flop, the start signal and the stop signal are connected to the input terminal of the OR gate, the output terminal of the OR gate is connected to the R terminal of the RS flip-flop, the S terminal of the RS flip-flop receives the photon signal, and the RS flip-flop The Q terminal is the output terminal of the signal input logic unit.

[0023] The timing unit includes a current mirror structure that provides a stable charging current, a current mirror structure that provides a current source, and a timing capacitor. The current mirror struct...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a time-analog switching circuit and a single photon flight time measuring method. The time-analog switching circuit comprises a signal input logic unit, a timing unit, a voltage holding unit and a read out unit; the signal input logic unit converts a photon signal into a logic electrical level, and the input end of the signal input logic unit correspondingly receives the photon signal, a start signal and a stop signal, and the output end of the signal input logic unit is connected with the input end of the timing unit; the timing unit includes a current mirror structureproviding a stable charging current, a current mirror structure providing a current source and a timing capacitor, and a voltage of an electrode plate of the timing capacitor linearly increases withtime after the timing capacitor starts counting; the voltage holding unit is used for holding the voltage of the electrode plate of the timing capacitor, the input end of the voltage holding unit is connected with the output end of the timing unit, the output end of the voltage holding unit is connected with the read out unit, and the read out unit reads out a voltage signal of the electrode plate. According to the time-analog switching circuit and the single photon flight time measuring method, the manufacturing process is compatible with the CMOS process, the manufacturing cost is low, and the rate of finished products is high; and meanwhile, the time-analog switching circuit has the advantages of high filling factors, high resolution and a large measuring range.

Description

technical field [0001] The invention relates to a time-analog conversion circuit for measuring single-photon time-of-flight (TOF) and a method for measuring TOF by the circuit, in particular to a single-photon time-of-flight detection circuit and measurement method based on a Wilson current source. Background technique [0002] Single-Photon Avalanche Diode (SPAD) has significant advantages such as large avalanche gain, fast response speed, high detection efficiency, low cost, and low power consumption. It has broad application prospects in detection, laser ranging, 3D imaging, etc. These application areas all require photon time-of-flight (TOF) measurement to obtain time-correlated single-photon counting / timing results. The methods for measuring the time of flight of photons mainly include time-to-digital conversion circuit TDC and time-to-analog conversion circuit TAC. [0003] The detection time of TDC is affected by the time resolution. As the detection distance increa...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G04F10/00G01J1/44
Inventor 朱思慧徐跃李鼎吴仲
Owner NANJING UNIV OF POSTS & TELECOMM
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products