Unlock instant, AI-driven research and patent intelligence for your innovation.

A fast measuring device for laser damage threshold of optical thin film

A technology of laser damage threshold and optical thin film, which is applied in the direction of testing optical properties, can solve problems such as laser beam performance change, optical thin film damage, beam phase and wavefront distortion, and achieve uniform distribution of light field intensity and shortened measurement cycle. Effect

Active Publication Date: 2020-07-10
CHANGCHUN UNIV OF SCI & TECH
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Damage to the optical film causes changes in the properties of the laser beam transmitted in it, destroys the quality of the laser beam, causes beam phase and wavefront distortion, and can even cause catastrophic damage to the laser
[0003] However, the current measurement of laser damage threshold mainly uses laser beams to directly irradiate optical films, and laser irradiation can only test one measurement point at a time, while 1-ON-1, R-ON-1 and S-ON-1 The test method requires that the same pulse energy density be irradiated no less than 10 times to obtain the damage probability under the irradiation energy density. Due to the poor energy consistency between the laser output pulses, it is impossible to accurately control the radiation under the same pulse energy density. According to the requirements of multiple points; and the measurement process often needs to test hundreds of points, the measurement accuracy is low, the efficiency is extremely low, and it cannot objectively and accurately reflect the laser damage threshold of the film

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A fast measuring device for laser damage threshold of optical thin film

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0028] Embodiment 1 A fast measuring device for laser damage threshold of an optical thin film.

[0029] as attached figure 1 As shown, a fast measuring device for laser damage threshold of an optical thin film provided by the present invention includes a host computer 1, a system controller 2, a laser power supply 3, a laser 4, a beam splitter A5, a laser beam irradiation unit, an energy density calibration unit, an optical Film damage identification unit, pulse width detection unit 8 and one-dimensional motion table 9;

[0030] The host computer 1 is an industrial control computer, which sends control instructions to the system controller 2, processes data information from the system controller 2, and digitally outputs and displays measurement results;

[0031] The system controller 2 is a control system based on a single-chip microcomputer, triggers the laser power supply 3, the energy detector 601, the image sensor A604 and the image sensor B701 to work according to the c...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a fast measuring device for laser damage threshold of an optical thin film, which comprises a host computer (1), a system controller (2), a laser power supply (3), a laser (4), a beam splitter A (5), a laser beam Irradiation unit, energy density calibration unit, optical film damage identification unit, pulse width detection unit (8) and one-dimensional motion table (9); Unit A (501) and beam splitting and focusing unit B (602) realize uniform beam splitting of the incident laser beam, a single pulse realizes radiation measurement of no less than 10 array test points, and the light field intensity distribution of each focus point is uniform, The energy deviation between each sub-beam is not more than ±1%. The arrangement of each sub-spot on the focal plane is 1×N or N×N. Compared with the traditional single-shot pulse, only one test point is measured, and the measurement cycle is shortened by ten. times, the laser damage threshold of optical thin films can be quickly and accurately measured.

Description

technical field [0001] The invention relates to a fast measuring device for laser damage threshold of an optical thin film, which belongs to the technical field of laser testing. Background technique [0002] Optical thin films are the weakest link in lasers and their applied optical systems. The damage of the optical thin film causes changes in the properties of the laser beam transmitted in it, destroys the quality of the laser beam, causes beam phase and wavefront distortion, and even causes catastrophic damage to the laser. [0003] However, the current measurement of laser damage threshold mainly uses laser beams to directly irradiate optical films, and laser irradiation can only test one measurement point at a time, while 1-ON-1, R-ON-1 and S-ON-1 The test method requires that the same pulse energy density be irradiated no less than 10 times to obtain the damage probability under the irradiation energy density. Due to the poor energy consistency between the laser outp...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
Inventor 王菲刘长青李玉瑶于彪王彩霞田明丁伟戚伟佳王奂罗宽
Owner CHANGCHUN UNIV OF SCI & TECH