Unlock instant, AI-driven research and patent intelligence for your innovation.

Cavitation and Fenton reaction-assisted low pressure homogeneous polishing method and cavitation and Fenton reaction-assisted low pressure homogeneous polishing device for silicon carbide plane

A Fenton reaction and polishing device technology, which is applied to surface polishing machine tools, grinding/polishing equipment, machine tools suitable for grinding workpiece edges, etc., can solve the problem of low surface roughness and surface uniformity processing of single crystal silicon carbide High efficiency, low surface roughness and other issues, to achieve the effect of increasing the randomness of motion, good surface quality, and uniform silicon carbide plane

Active Publication Date: 2019-08-30
ZHEJIANG UNIV OF TECH
View PDF4 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] In order to overcome the shortcomings of low surface roughness, high surface quality, uniform surface, and high-efficiency processing when the existing polishing method processes silicon carbide planes, the present invention provides a low-pressure silicon carbide plane assisted by cavitation and Fenton reaction. The method and device for uniform polishing can make the processed single crystal silicon carbide have low surface roughness, high surface quality, good surface uniformity and high processing efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Cavitation and Fenton reaction-assisted low pressure homogeneous polishing method and cavitation and Fenton reaction-assisted low pressure homogeneous polishing device for silicon carbide plane
  • Cavitation and Fenton reaction-assisted low pressure homogeneous polishing method and cavitation and Fenton reaction-assisted low pressure homogeneous polishing device for silicon carbide plane
  • Cavitation and Fenton reaction-assisted low pressure homogeneous polishing method and cavitation and Fenton reaction-assisted low pressure homogeneous polishing device for silicon carbide plane

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] The present invention will be described in detail below according to the accompanying drawings and preferred embodiments, and the purpose and effect of the present invention will become clearer. The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0033] A kind of cavitation and Fenton reaction assisted silicon carbide plane low-pressure homogenization polishing method, the method comprises the following steps:

[0034] S1: Put the silicon carbide workpiece in the pretreatment workpiece groove, seal it with negative compression material, and only expose the plane to be polished;

[0035] S2: Put the silicon carbide sheet treated in S1 into Fenton's reagent for pretreatment, so that a silicon dioxide corrosion layer is formed on the surface of si...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
particle diameteraaaaaaaaaa
quality scoreaaaaaaaaaa
Login to View More

Abstract

The invention discloses a cavitation and Fenton reaction-assisted low pressure homogeneous polishing method and a cavitation and Fenton reaction-assisted low pressure homogeneous polishing device fora silicon carbide plane. The method comprises the following steps: first, pre-treating a to-be-processed workpiece by means of Fenton reaction to generate a silicon dioxide corrosion layer on the surface of the to-be-processed workpiece to reduce the surface hardness; and then generating cavitation bubbles in an abrasive particle flow by means of a cavitation effect to increase the moving randomness of the abrasive particles, wherein the kinetic energy of the abrasive particles near the surface of silicon carbide is greater and the processing efficiency is improved. The silicon carbide workpiece pre-treated by Fenton reaction by means of the abrasive particle flow of the cavitation effect and a constraining module adjustable in included angle with the surface of the workpiece, so that theshearing strength of the abrasive flow to the processed surface in the flowing direction is uniform, and therefore, a uniform polishing purpose is achieved. The workpiece polished by the polishing method and the polishing device is uniform, high in processing efficiency, low in surface coarseness and high in surface quality.

Description

technical field [0001] The invention belongs to the field of ultra-precision machining, and in particular relates to a silicon carbide plane low-pressure homogenization polishing method assisted by cavitation and Fenton reaction. Background technique [0002] Silicon carbide is a representative of the third-generation semiconductor materials. It has a wide band gap, high critical breakdown field strength, high electron mobility, and high thermal conductivity, and has broad application prospects in production. At present, silicon carbide has been widely used in the fields of abrasives, metallurgy, LED solid-state lighting and high-frequency devices, especially in electronic applications such as high temperature and high pressure, and in extreme environments such as aerospace and military industries. [0003] High-purity single-crystal silicon carbide is an important material for the manufacture of semiconductors. The application of single crystal silicon carbide requires no ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): B24B31/116B24B1/04H01L21/304
CPCB24B1/04B24B31/116H01L21/304
Inventor 赵军方海东彭浩然
Owner ZHEJIANG UNIV OF TECH