Semiconductor film field effect transistor made of unstable two-dimensional material and preparation method thereof
A thin-film field effect, two-dimensional material technology, applied in semiconductor/solid-state device manufacturing, semiconductor devices, transistors, etc., can solve the problems of high alignment difficulty, extraction error, low success rate, etc., and achieves low manufacturing process difficulty, electrical Low hysteresis and low energy attenuation
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Embodiment 1
[0059] A semiconductor thin film field effect transistor of an unstable two-dimensional material, which comprises a silicon wafer substrate, an unstable two-dimensional material, an aluminum oxide film, a source electrode and a drain electrode sequentially from bottom to top.
[0060] Unstable two-dimensional materials are indium selenide (InSe), black phosphorus, transition metal sulfides, or III-VI compounds. The thickness of the unstable 2D material is 20-80nm. The aluminum oxide thin film has a thickness of 20 nm.
Embodiment 2
[0062] According to the semiconductor thin film field effect transistor of an unstable two-dimensional material described in Embodiment 1, the difference lies in that the thickness of the aluminum oxide film is 40 nm.
Embodiment 3
[0064] According to the semiconductor thin film field effect transistor of an unstable two-dimensional material described in Embodiment 1, the difference lies in that the thickness of the aluminum oxide film is 30 nm. The 30nm alumina can play a better isolation effect, so that the process solvent and air have less influence on the semiconductor material, and at the same time, the photoresist will not be etched too much due to the relatively small etching selection during the rear etching. This results in difficulty in electrode stripping.
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