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Transient current waveform and parameter measurement device of terahertz transit time device switch

A transit time and switching transient technology is applied in the field of terahertz transit time device switching transient current waveform and parameter measurement device, and can solve the problem of inability to measure the switching transient current waveform and parameters of terahertz transit time devices.

Active Publication Date: 2020-09-29
WENZHOU UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

As another example, the authorized patent number is ZL201410401893.0, which is an invention patent named a diode forward recovery parameter comprehensive test platform, which can measure and evaluate the forward recovery waveform, forward recovery time, Forward recovery voltage peak value and other parameters, but can not measure the switching transient current waveform and parameters of terahertz transit time devices

Method used

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  • Transient current waveform and parameter measurement device of terahertz transit time device switch
  • Transient current waveform and parameter measurement device of terahertz transit time device switch
  • Transient current waveform and parameter measurement device of terahertz transit time device switch

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Embodiment Construction

[0053] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0054] Such as figure 1 As shown, in the embodiment of the present invention, a terahertz transit time device switching transient current waveform and parameter measurement device are provided, including a single-chip microcomputer 1, a display unit 2, a high-frequency pulse current source circuit 3, and a blocking pulse voltage Source circuit 4, switch transient current waveform detection circuit 5 and switch transient current signal processing circuit 6; wherein,

[0055] The input terminal of the high-frequency pulse current source circuit 3 is connected to the first terminal a1 of the single-chip microcomputer 1, and the output terminal is connected to the anode (+) of the terahertz transit time device (DUT) to be tested for receiving the first terminal a1 iss...

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Abstract

The invention provides a switching transient current waveform and parameter measuring device of a terahertz transit time device, including a single-chip microcomputer, a display unit, a high-frequency pulse current source circuit, a blocking pulse voltage source circuit, a switching transient current waveform detection circuit and a switch Transient current signal processing circuit. When the single-chip microcomputer sends the first pulse signal to the high-frequency pulse current source circuit and the first detection instruction to the switch transient current waveform detection circuit, it receives the instantaneous When the transient current signal is turned on, or when the second pulse signal is issued to the blocking pulse voltage source circuit and the second detection instruction is issued to the switch transient current waveform detection circuit, the signal processing circuit receiving the switch transient current signal is to be tested. Transient current signals instantaneously blocked by terahertz transit-time devices. By implementing the invention, the transient current waveforms and parameters of the forward conducting and reverse blocking of the device are obtained, the measurement reliability is improved, and the operation difficulty is reduced.

Description

technical field [0001] The invention relates to the technical field of electronic components, in particular to a switching transient current waveform and a parameter measuring device of a terahertz transit time device. Background technique [0002] Different from ordinary semiconductor diodes, triodes, field effect transistors, laser diodes, photodetectors and other devices, the operating frequency of terahertz transit time devices is in the range of 0.1-10 terahertz or the wavelength is in the range of 0.03-3 mm. Terahertz waves have the characteristics of high transmission, low energy, water absorption, coherence, fingerprints, transients, etc. The field has broad application prospects. The transient nature of terahertz waves means that its pulse width is very narrow (picosecond level), and it is convenient to conduct time-resolved spectroscopy studies on various materials including liquids, gases, semiconductors, high-temperature superconductors, ferromagnets, etc., and ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26G01R19/04G01R29/02G01R29/04G01R1/30H03K17/082H02M9/00
CPCG01R1/30G01R19/04G01R29/02G01R29/04G01R31/2603G01R31/2637H03K17/082
Inventor 韦文生
Owner WENZHOU UNIVERSITY
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