Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Stress-controllable stress silicon and preparation method thereof

A technology of stress silicon and stress, which is applied in the field of stress controllable stress silicon and its preparation, can solve the problems of restricting the operating frequency of silicon electronic devices, the low modulation efficiency of silicon-based modulators, and the inability to absorb long-wavelength light

Active Publication Date: 2021-09-10
SANMING UNIV
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For example, due to the limitation of carrier mobility in silicon, the operating frequency of silicon electronic devices is restricted; silicon cannot absorb long-wavelength light due to its large band gap; silicon does not have the first-order electro-optic effect, and the modulation of silicon-based modulators not efficient etc.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Stress-controllable stress silicon and preparation method thereof
  • Stress-controllable stress silicon and preparation method thereof
  • Stress-controllable stress silicon and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0046] Please refer to Figure 1-4 , this embodiment provides a method for preparing stress-controllable stress silicon 100, which includes:

[0047] The amorphous silicon growth window 120 is formed by etching the silicon waveguide region 110 , and the amorphous silicon growth window 120 is formed by etching the upper surface of the silicon waveguide region 110 . The amorphous silicon growth windows 120 are all rectangular, the width direction of the amorphous silicon growth windows 120 is set along the width direction of the silicon waveguide region 110, the length direction of the amorphous silicon growth windows 120 is set along the length direction of the silicon waveguide region 110, and The crystal silicon growth windows 120 are distributed in a rectangular array in the silicon waveguide region 110 .

[0048] Depositing amorphous silicon 130 in the amorphous silicon growth window 120, and covering the surface of the deposited amorphous silicon 130 with a silicon dioxid...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Thicknessaaaaaaaaaa
Thicknessaaaaaaaaaa
Wavelengthaaaaaaaaaa
Login to View More

Abstract

The invention discloses stress-controllable stress silicon and a preparation method thereof, and relates to the technical field of stress silicon. The preparation method comprises the following steps: etching a silicon waveguide region to form amorphous silicon growth windows, wherein the amorphous silicon growth window is formed by etching the upper surface of the silicon waveguide region, and the amorphous silicon growth windows are rectangular and are distributed in the silicon waveguide region in a rectangular array manner; depositing amorphous silicon in the amorphous silicon growth window, and covering the surface of the deposited amorphous silicon with a silicon dioxide layer; and irradiating the amorphous silicon growth window with light with a wavelength of 488 nm to convert at least one part of the amorphous silicon in the amorphous silicon growth window into monocrystalline silicon. According to the technical scheme, the carrier mobility of the stress silicon is improved, the working frequency of a device is improved, a first-order electro-optical effect is achieved, tensile stress is generated in the silicon to reduce the band gap of the silicon, and signal light of a C communication wave band can be absorbed.

Description

technical field [0001] The invention relates to the technical field of stressed silicon, in particular to stress-controllable stressed silicon and a preparation method thereof. Background technique [0002] Silicon is a semiconductor material that is the main material that constitutes today's electronic information systems. The substrate of today's electronic information integrated circuits is mainly silicon material, and silicon has a mature CMOS processing technology, and has the advantages of large size and low cost. In addition, based on the mature CMOS process, silicon-based integrated optoelectronic technology has also been developed in full swing and initially put into commercial use. [0003] However, for the requirements of rich and efficient information processing, silicon materials gradually show some deficiencies in the fields of integrated electronics and integrated optoelectronics. For example, due to the limitation of carrier mobility in silicon, the operati...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L21/8238H01L27/092H01L29/06
CPCH01L21/823892H01L27/092H01L29/0603H01L29/0684Y02P70/50
Inventor 崔积适
Owner SANMING UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products