Mirowave plasma torch full spectometer

A technology of microwave plasma and spectrometer, which is applied in the fields of emission spectrum, spectrum investigation, material excitation analysis, etc., to achieve the effect of improving analysis performance, volume and compactness, and enhancing stability

Inactive Publication Date: 2004-02-11
JILIN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to overcome the above-mentioned shortcomings and deficiencies existing in the current commercialized microwave plasma torch spectrometer, adopt a modular design, and apply an ultraviolet-enhanced linear CCD array detector to realize multi-element, multi-element Simultaneous detection of wavelengths fundamentally eliminates the problems of slow analysis speed and large sample consumption in the sequential scanning microwave plasma torch spectrometer; a new spectroscopic detection system is designed to eliminate the mechanical wear problem of the scanning structure and increase the reliability of the analysis results sex

Method used

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  • Mirowave plasma torch full spectometer

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Embodiment 1

[0015] Embodiment 1 The overall structure of the microwave plasma torch spectrometer of the present invention.

[0016] See figure 1 , the overall structure of the present invention is divided into six parts, including sample introduction system 1, microwave power source system 2, microwave plasma torch system 3, optical path system 4, spectroscopic detection system 5 and computer system 6.

[0017] The carrier gas source 21 is connected to the carrier gas inlet of the sample introduction system 1 ; the shielding gas source 22 is connected to the outer tube of the microwave plasma torch system 3 . The inner conductor and the outer conductor of the microwave transmission line joint of the microwave power source system 2 are respectively short-circuited with the middle tube and the outer tube of the microwave plasma torch system 3 . The microwave power source system 2 couples microwave energy to the plasma torch system 3, and the carrier gas (usually argon, air or helium can al...

Embodiment 2

[0018] Example 2 The sample introduction system of the microwave plasma torch spectrometer of the present invention.

[0019] The sample introduction system 1 of the present invention is basically the same as the background technology, and it will be introduced here with the accompanying drawings, which will help the understanding of the present invention.

[0020] figure 2 Among them, 12 is the carrier gas inlet, 13 is the sample solution inlet, the sample solution is lifted to the nebulizer 7 under the action of the carrier gas (or peristaltic pump, after passing through the nebulizer 7, the sample solution forms a sample wet aerosol, wet The aerosol passes through the mist chamber 8 under the carrier gas, where the large-particle aerosol is deposited due to gravity and is discharged out of the system through the waste discharge port 14, and the remaining small-particle wet aerosol passes through the heating desolvation tube 9 , is heated above 100 degrees Celsius to separ...

Embodiment 3

[0021] Embodiment 3 The spectroscopic detection system of the microwave plasma torch spectrometer of the present invention.

[0022] See Fig. 3, 31 is light entrance, corresponds to one end of optical fiber 24; 32 is light-parallel concave mirror, the light that optical fiber 24 transmits is reflected as parallel light, then irradiates on grating 33, and grating 33 can be flat image field grating ; Here the composite light is split into monochromatic light according to the wavelength distribution by the grating 33, and projected onto the ultraviolet-enhanced linear CCD array detector 44 after the light is converged by the concave mirror 34 to realize the photoelectric conversion of the entire wavelength range. The converted electrical signal is displayed and printed by the display and printing system 6 controlled by the computer, and the simultaneous measurement of multiple elements (multi-wavelength) in the sample solution is completed.

[0023] The spectroscopic detection mo...

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Abstract

The microwave plasma torch full spectrometer is a kind of spectral instrument for simultaneous multispectral detection in atomic emission spectrum analysis. The structure includes built-in water cooled microwave power source system, microwave plasma torch system, optical path system comprise concave reflector and optical fiber, spectroscopic detection system with spectroscopic detection module comprising flattening grating and ultraviolet enhanced array detector, and computer system. The present invention has small volume, small stable microwave power, conveniently altered spectral range, simultaneous detection of multiple elements, and other advantages.

Description

technical field [0001] The invention belongs to a multi-element (multi-wavelength) simultaneous detection atomic emission spectrum device for atomic emission spectrum analysis Background technique [0002] Currently, the instruments used in the field of atomic emission spectroscopy mainly include inductively coupled plasma spectrometers and sequential scanning microwave plasma torch spectrometers. After nearly 30 years of development, commercial ICP spectrometers have become very mature in technology. The instrument types are also very complete, including sequential scan type, multi-channel type and full-spectrum type. However, the purchase, operation and maintenance costs of the ICP spectrometer are very high. It is not completely suitable for developing countries, small and medium-sized enterprises and institutions of higher learning. In recent years, the commercialized microwave plasma torch spectrometer has solved the problem of high cost of inductively coupled plasma...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/443G01N21/73
Inventor 金钦汉曹彦波郇延富冯国栋费强姜杰汪淑华王兴华
Owner JILIN UNIV
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