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Ce-doped lutetium gadolimium silicate submicron image transparent screen and its preparation method

A fluorescent screen, lutetium silicate technology, applied in the direction of discharge tube fluorescent screen, tube/lamp screen manufacturing, chemical instruments and methods, etc., can solve the problems of long light decay time, effective atomic number, low density, low resolution, etc. The effect of increasing the resolution

Inactive Publication Date: 2005-01-05
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0003] SCF transparent fluorescent screens such as CsI(Tl), Ce:YAG / YAG and Ce:LuAG / YAG in the prior art have the following disadvantages: (1) effective atomic number and density of CsI(Tl) and Ce:YAG crystals are all very small (Z eff They are 54.1 and 32 respectively, and the density is 4.52g / cm 3 and 4.55g / cm 3 ), therefore, their X-ray absorption capacity and ray-to-light conversion efficiency are low
In order to improve its resolution, the thickness of the film must be increased. According to the imaging line spread function (LSF), the increase of the thickness will reduce the resolution of the transparent phosphor screen (the resolution is approximately equal to their thickness); (2) Although Ce:LuAG has Large effective atomic number and high density (Z eff =58.9, density=6.67g / cm 3 ), but its light output is small (3000Ph / Mev), and the lattice mismatch between LuAG and YAG as the substrate is relatively large, which is not conducive to growing high-quality single crystal thin films on the substrate, which will Can seriously affect the optical performance of transparent fluorescent screen; (3) in addition, CsI (Tl) thin film is easy to deliquescence, and its light attenuation time is longer (600ns), is not suitable for fast real-time microscopic X-ray imaging; (4) in addition, prior art The resolution of the SCF film in the film is relatively small, about 0.7-0.8 microns

Method used

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  • Ce-doped lutetium gadolimium silicate submicron image transparent screen and its preparation method

Examples

Experimental program
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Effect test

Embodiment 1

[0035] Embodiment 1: (Ce 0.001 Lu 0.999 ) 2 SiO 5 / Lu 2 SiO 5 , transparent fluorescent screen

[0036] The selected resistance heating liquid phase epitaxy furnace is as figure 1 In the shown device, the crucible 9 in the main body furnace 101 is a platinum crucible. Polycrystalline raw material (Ce 0.001 Lu 0.999 ) 2 SiO 5 with co-solvent (PbF 2 :PbO:PbO 2 =55wt%: 15wt%: 30wt%) is (Ce 0.001 Lu 0.999 ) 2 SiO 5 / (PbF 2 -PbO-PbO 2 ) = 0.10, weigh a total of 500g, mix evenly and put it into a platinum crucible 9 of 80×50mm; according to process step , the size is 30×0.03mm, and the crystal plane direction is (010) Lu 2 SiO 5 Place the substrate 8 in the jig 7, put the jig 7 into the bottom end of the rotating pull rod 6, adjust the position of the crucible 9 and the substrate wafer 8 to make them coaxial, and both are in the center of the main furnace body 101; follow the above steps Heat the furnace body 101 to 1200°C to melt the raw materials and flux t...

Embodiment 2

[0038] Embodiment 2: (Ce 0.01 Lu 0.99 ) 2 SiO 5 / Lu 2 SiO 5 Transparent fluorescent screen

[0039] (Ce 0.001 Lu 0.999 ) 2 SiO 5 Polycrystalline material and co-solvent Li 2 Mo 2 o 7 Y by weight percentage 0.9999 Ce 0.0001 AlO 3 / Li 2 Mo 2 o 7 =0.40 proportioning weighed a total of 500g, according to step in the above-mentioned embodiment 1, the size is 20 × 0.03mm, the crystal plane direction is (001) Lu 2 SiO 5 The substrate 8 is placed in the fixture 7, and the fixture 7 is loaded into the bottom end of the rotating pull rod 6, and the positions of the crucible 9 and the substrate wafer 8 are adjusted to be coaxial, and they are all located in the center of the main furnace body 101; In Example 1, raise the temperature of the furnace body 101 to 1200°C, melt the raw materials and flux to form a saturated solution 10, and after keeping the temperature at 1200°C for 5 hours, gradually lower and rotate the lifting rod 6 according to in the above-mentione...

Embodiment 3

[0040] Embodiment 3: (Ce 0.005 Y 0.5 Lu 0.495 ) 2 SiO 5 / (Y 0.5 Lu 0.5 ) 2 SiO 5 Transparent fluorescent screen

[0041] (Ce 0.005 Y 0.5 Lu 0.495 ) 2 SiO 5 Polycrystalline material and co-solvent K 2 Mo 2 o 7 By weight percentage is (Ce 0.005 Y 0.5 Lu 0.495 ) 2 SiO 5 / K 2 Mo 2 o 7 =0.30 proportioning is weighed totally 500g, according to the step in the above-mentioned embodiment 2, the (Y 0.5 Lu 0.5 ) 2 SiO 5 The substrate 8 is placed in the fixture 7, and the fixture 7 is loaded into the bottom end of the rotating pull rod 6, and the positions of the crucible 9 and the substrate wafer 8 are adjusted to be coaxial, and they are all located in the center of the main furnace body 101; In Example 2, raise the temperature of the furnace body 101 to 1100°C, melt the raw materials and flux to form a saturated solution 10, and after keeping the temperature at 1100°C for 5 hours, gradually lower and rotate the lifting rod 6 according to in the above-ment...

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Abstract

The invention cerium doped lutetirum illinium aluminate submicro imaging fluorescence screen and the manufacturing method, the formula of the transparent fluorescence screen is (CexYyLu1-x-y)2SiO5 / (Lu1-zYz)2SiO5, the x is not less than 0.001 and not more than 0.01, the y is not less than zero and not more than 0.5, the z is not less than zero and not more than 0.5, the invention carries on large area seed crystal on the (Lu1-zYz)2SiO5 single crystal substrate with crystal surface direction of (010), (100), or (001), in the resistance heating phase extended furnace, under the crystallization temperature of the (CexYyLu1-x-y)2SiO5 single crystal, grows a (CexYyLu1-x-y)2SiO5 single crystal film with micrometer or submicro magnitude on the interface of the flux saturate liquid containing (CexYyLu1-x-y)2SiO5 polycrystal material.

Description

technical field [0001] The invention relates to a submicron imaging transparent fluorescent screen, in particular to a cerium-doped lutetium-gadolinium silicate submicron imaging transparent fluorescent screen and a preparation method thereof. The transparent fluorescent screen can be widely used in radiation detection such as medicine, scientific research, industrial online detection, and safety inspection. field. Background technique [0002] Microscopic X-ray imaging technology is mainly composed of X-ray source, micro-optical lens (objective lens and eyepiece), charge-coupled device (CCD) or amorphous silicon array (a-Si:H) and scintillation single-crystal film transparent fluorescent screen coupling detection devices etc. This microscopic imaging technology has the advantages of submicron resolution, high detection efficiency, high degree of digitization, and online real-time detection. It plays an important role in the field of microscopic X-ray imaging such as phase ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C09K11/77H01J1/63H01J9/20
Inventor 赵广军徐军庞辉勇介明印何晓明周圣明
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI