Biological total internal reflection type near-field scan microscope

A technology of total internal reflection and near-field scanning, applied in the field of near-field scanning imaging optics, which can solve the problems of low image signal-to-noise ratio, low biological reflectivity, and weak information.

Inactive Publication Date: 2005-03-02
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

Although the near-field scanning imaging technology has gradually matured, the resolution of near-field optical scanning microscopy has not been conclusive, and it is still being improved until now.
[0004] (2) There is a lack of universally recognized theories to describe

Method used

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  • Biological total internal reflection type near-field scan microscope
  • Biological total internal reflection type near-field scan microscope
  • Biological total internal reflection type near-field scan microscope

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Embodiment Construction

[0049] see Figure 7 with Figure 8 , Figure 7 with Figure 8 The optical path diagrams of Embodiment 1 and Embodiment 2 of the biological total internal reflection near-field scanning microscope for biological microstructure detection according to the present invention are shown respectively. It can be seen from the figure that the biological total internal reflection near-field scanning microscope of the present invention is composed of four parts: the first part is the excitation part, which is composed of a laser 1, a collimator and an optical system 2 composed of reflectors; The wave part is composed of an inverted trapezoidal prism 3 and the sample to be measured attached to its top surface; the third part is the information collection, storage and processing part, which is composed of an optical fiber probe 4, a driving scanning part 5, a photoelectric probe 10 and a computer 12 The fourth part is the height control part of the optical fiber probe 4, which is compos...

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Abstract

A biology inside total reflection near field scanning microscope is consisted of four parts. The first is excitation part comprising laser maser, collimation and reflector of optical system, the second is wave creation part comprising inverse trapezoidal prism and sample to be tested on its top surface, the third is collection, storage and disposal of information comprising optical fiber probe, driving scanning part and second photoelectric probe head and computer, and the fourth is fiber probe height controller comprising optical information colleting part and first photoelectric probe head, and the fourth one has the property of having a fluorescent dye macromolecule or enzyme or quantum point sticking to needle tip or near that of the fiber probe. Being a optical total reflection near field scanning microscope used in testing biological cell microstructure and single element, the invention can also uncover the discipline, which can create the most effective spatial resolution.

Description

technical field [0001] The invention relates to near-field scanning imaging optics, in particular to a biological total internal reflection near-field scanning microscope for biological research. Background technique [0002] In 1928, E.H.Synge first proposed the idea of ​​near-field scanning imaging, which opened up a new way of super-diffraction limit resolution imaging. In the 1970s, people used microwaves to realize the initial near-field optical scanning imaging, and it has a history of more than 30 years. Although the near-field scanning imaging technology has gradually matured, the resolution of near-field optical scanning microscopy has not been settled, and it is still improving until now. For example, the revelation of the spatial coherence phenomenon related to the distance of the object interface provides a theoretical basis for further improving the resolution, and the use of a lock-in amplifier to lock the vibration frequency of the probe in order to accuratel...

Claims

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Application Information

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IPC IPC(8): G01N21/64G01N21/76G01Q60/18
Inventor 王桂英肖繁荣刘力王琛周增会徐至展
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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