Plane button type packing technology of integrated circuit or discrete component and its packing structure

A planar bump type, discrete component technology, applied in the direction of electrical components, circuits, electrical solid devices, etc., can solve the problems affecting solderability, air residue, water absorption rate increase, etc., to achieve reliability assurance and stable quality , Yield rate improvement effect

Active Publication Date: 2006-01-25
长电科技管理有限公司
View PDF0 Cites 22 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 2. Chemical adhesive film: due to the penetrating etching method, it will cause overflow during the encapsulation process
[0005] 3. Pollution: Because of the use of chemical tape, the adhesive of the film is easily vaporized due to high temperature in various high-temperature processes, and indirectly pollutes or covers the surface of the chip's pressing area and the wiring area, often causing wiring Instability of ability
[0009] B. Because of the fear of a large amount of rework after flashing, I dare not use a large encapsulation pressure. As a result, the plastic encapsulation compound is loose, the water absorption rate is increased, and the density is reduced, which seriously increases the production cost and yield cost;
[0010] C. The part of the bottom output pin of the four-sided surface mount type package is at the same height as the surface of the plastic package or even recessed. During the surface mount process, there will be a problem of poor contact due to poor coplanarity of the soles of the feet; at the same time, due to The outer pin is sunken in the plane of the plastic package, air will remain in the sunken during surface mount operation, and the contact will be broken after the high-temperature air expands;
[0011] D. Because the output pin and the plastic package are on the same plane or even recessed, it is easy to cause the solder paste on the surface of the protruding pin to connect to ea

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Plane button type packing technology of integrated circuit or discrete component and its packing structure
  • Plane button type packing technology of integrated circuit or discrete component and its packing structure
  • Plane button type packing technology of integrated circuit or discrete component and its packing structure

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0058] The integrated circuit or discrete component planar bump packaging process of the present invention consists of the following steps:

[0059] 1) Substrate-see figure 1 , Take a piece of metal base plate 1 with appropriate thickness. The material of the metal substrate 1 can be changed according to the functions and characteristics of the chip, such as nickel-iron alloy, pure copper, or copper alloy.

[0060] 2) Pasting dry film-see Figure 2, paste dry film layers 2 and 3 on the front and back sides of the metal substrate to protect the subsequent etching process.

[0061] 3) Remove the upper part of the dry film-see image 3 , The dry film on the upper layer of the metal substrate 1 is removed, and a base island and pins are prepared on the metal substrate 1, which is intended to expose the area on the upper layer of the substrate that needs to be plated with a metal layer.

[0062] 4) The metal plating layer on the substrate-see Figure 4 , Plating the required metal laye...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

This invention relates to a plane salient point encapsulation technology and its structure of IC or discrete components, among which, the technology includes: taking a base plate, dry-film layers are pasted to the front and back side of the base plate, removing part of the upper layer for the preparation of forming a basic island and pins, plating metal layers on the front, removing the rest dry film on the upper layer of the base plate, semi-etching it, removing the dry film on the back, implanting the chip, wiring, packaging with plastic capsule, pasting a dry film on the back of the base plate again, etching the dry film at the back and the rest of the metal of the semi-etched zone again so as to enable the back of the basic island and the pin projecting over the plastic capsule, removing the rest dry film, plating metal layers on the surface, pasting film on the front of the plastic capsule then cutting.

Description

Technical field: [0001] The invention relates to a planar bump packaging process for integrated circuits or discrete components and a packaging structure thereof. It belongs to the technical field of packaging of integrated circuits or discrete components. Background technique: [0002] The traditional ultra-thin leadless packaging process and packaging structure of integrated circuits or discrete components, the packaging type is a four-sided leadless surface mount package, and the display assembly is cut into a single unit. Its substrate type is lead frame type. It mainly has the following deficiencies: [0003] 1. Lead frame: The lead frame is made by penetrating etching. [0004] 2. Chemical adhesive film: because of the penetrating etching method, it will cause overflow during the encapsulation process. [0005] 3. Pollution: Because of the use of chemical tape, the adhesive of the film is easily vaporized due to high temperature in various high-temperature processe...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H01L21/50
CPCH01L24/97H01L2224/32245H01L2224/45124H01L2224/45139H01L2224/45144H01L2224/45147H01L2224/48091H01L2224/48247H01L2224/73265H01L2224/92247H01L2224/97H01L2924/14H01L2924/181H01L2924/00014H01L2924/00012H01L2924/00
Inventor 王新潮于燮康梁志忠谢洁人陶玉娟葛海波王达
Owner 长电科技管理有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products