Single-nano-thread in-situ mechanical characteristic detection and structure analysis method and apparatus

A technology for structural analysis and nanowires, which is used in measurement devices, preparation of test samples, and analysis of materials. simple effect

Inactive Publication Date: 2006-08-09
BEIJING UNIV OF TECH
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Problems solved by technology

Using this model to bend the beam beyond the critical yield point, the bending strength of carbon nanotubes and silicon carbide nanorods is also obtained. The operation process of this method is more complicated, and the measurement results are affected by human factors. Although it can be better in the elastic deformation stage of nanomaterials The elastic modulus of the nanowire or tube is measured, but when the material yields, the structural change of the nanowire during the yield process cannot be given, and the deformation mechanism cannot be fundamentally understood
[0004] The other is the experiment of stretching a single carbon nanotube using a combination of a scanning electron microscope (SEM) and an atomic force microscope. It was reported in "Science" in 2000, volume 287, pages 637-640. Two of them were installed in a scanning electron microscope. Atomic force microscope probe, two atomic force microscope probes are stretched outward and parallel to each other. They first glued the two ends of a single nanotube to the tips of the two probes, and then applied loads at both ends and examined them under the SEM. Tension observation, according to the elongation and the magnitude of the tensile force, the tensile strength of a single multi-walled carbon nanotube and single-walled carbon nanotube is obtained by calculation, and the fracture process of the elastic nanotube is observed. This method is complex and requires Reliable experimental data can only be obtained with higher experimental techniques. Although the process of stretching to fracture can be observed in situ with a scanning electron microscope, due to the limitation of the resolution of the scanning electron microscope, it is still necessary to put in a transmission tube after the nanotube is broken using this method. The electron microscope is used to observe and study its fracture behavior, but it cannot reveal its deformation mechanism in situ at the atomic level. This method is complicated and requires several different microscopic equipment to complete, which is not conducive to popularization.

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  • Single-nano-thread in-situ mechanical characteristic detection and structure analysis method and apparatus
  • Single-nano-thread in-situ mechanical characteristic detection and structure analysis method and apparatus
  • Single-nano-thread in-situ mechanical characteristic detection and structure analysis method and apparatus

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Embodiment 1

[0025] Put the Si nanowire powder in acetone and ultrasonically disperse it for 20 minutes, drop the suspension on a 100-mesh gold mesh plated with a 60nm-thick collodion support film, and fix the gold mesh on the sample rod of the transmission electron microscope. Put the sample seat into the transmission electron microscope, and adjust the electron beam current density at 2×10 at the accelerating voltage of 200KV 20 Electrons per square centimeter second, irradiating the collodion support film, the support film is curled and deformed, and the Si nanowire is bent and deformed. The diameter of the deformed nanowire is 30nm, the length is about 3μm, and the maximum strain of the nanowire is 2.5 %, the nanowires still maintain the original structure without fracture and plastic deformation, revealing that the Si nanowires have a large bending strength, figure 1 The transmission electron micrographs of the maximum bending are given, and the curled and deformed collodion support f...

Embodiment 2

[0027] Put the SiC nanowire powder in ethanol, disperse it by ultrasonic wave for 30 minutes, drop the dispersed suspension on a 1000-mesh copper grid coated with a collodion support film, the thickness of the collodion support film is 80nm, and fix the copper grid on Put the sample holder of the transmission electron microscope sample rod into the transmission electron microscope, and adjust the electron beam current density at 1×10 at the acceleration voltage of 80KV. 20 Electrons per square centimeter second, the collodion support film is irradiated, and the support film is curled and deformed, which drives the SiC nanowires distributed on it and around it to move or bend. One of them has a diameter of 200nm and a length of 4.3μm The deformation process of the SiC nanowires was measured in situ, and one of the SiC nanowires maintained fully elastic behavior up to 2% strain, figure 2 The high-resolution atomic lattice image at the maximum bending deformation is given, showi...

Embodiment 3

[0029] Put the SiC nanometer powder in ethanol, disperse it by ultrasonic wave for 10 minutes, drop the dispersed suspension on a 300-mesh nickel mesh coated with a collodion support film, the thickness of the collodion support film is 100nm, and fix the nickel mesh on Put the sample holder of the transmission electron microscope sample rod into the transmission electron microscope, and adjust the electron beam current density at 8×10 at the accelerating voltage of 300KV 25 Electrons / square centimeter, irradiated collodion support film, the support film was curled and deformed, a SiC nanowire with a diameter of 150nm and a length of 15μm was bent and deformed with the deformation of the support film, and the maximum bending elastic strain reached 2.0% Plastic deformation occurred later, and the process of plastic deformation of SiC nanowires was recorded in real time through high-resolution images. image 3 The high-resolution atomic lattice image shows the deformation charact...

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Abstract

Said invented belongs to nano material in situ characterization field. Said invented method contains putting nano line in organic solvent organic solvent, after ultrasonic dispersion 10-30 minute becoming suspension, dropping on metal grid coated with 60-120 nm collodion supporting film to make nano attached at supporting film, fixing metal grid on sample holder and putting in transmission electron microscope, measuring nano line unstretched length and diameter, adjusting transmission electron microscope beam voltage beam voltage as 80 KV to 400 KV and beam density as 20th power of 10 to 8X30th power of 10 electron/square centimeter second, to make collodion supporting film and nano line generating deformation, real time in situ recording nano line structural changes in deformation process, measuring nano line length line length and diameter after deformation, calculating nano length and diameter ratio and maximum strain quantity. Said invented has low cost and simple technology, capable of revealling one dimension nano line mechanical property from nano and atom level.

Description

Technical field: [0001] The invention relates to a method for in-situ bending and deformation of a single nanowire in a transmission electron microscope. The transmission electron microscope can be used to observe the change of the atomic structure of the deformation zone in real time, revealing the deformation mechanism of a single nanowire, and belongs to the field of in-situ characterization of nanomaterials . Background technique: [0002] With the development of nano-devices and the development of micro-mechanical systems, it is particularly urgent to study the mechanical properties of a single nanowire under external force. Transmission electron microscopy is a powerful tool for studying the microstructure of nanomaterials, but due to the small structure of nanomaterials , Difficult to manipulate, how to fix and in-situ deform a single nanowire sample in a transmission electron microscope, and reveal the deformation mechanism of a nanowire under external force from the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N13/10G01N1/38G01B21/00G01N23/04
Inventor 韩晓东张跃飞张泽
Owner BEIJING UNIV OF TECH
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