Method for producing 541 nano narrow band-pass photoelectric detector
A photodetector, nano-narrowband technology, applied in circuits, electrical components, semiconductor devices, etc., can solve the problems of high level of counterfeiting, can not fully meet the anti-counterfeiting needs of the fifth edition of RMB, reduce surface reflection loss, and improve photoelectric conversion. Efficiency, effects of improving stability and reliability
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
specific Embodiment
[0044] Part 1, Fabrication of Silicon Photodiode Chip
[0045] Use N-type, (100) crystal plane, single-sided polishing, resistivity about 4Ωcm, 450 micron thickness, 4-inch dislocation-free silicon epitaxial wafer as the substrate, RCA cleaning with FSI automatic cleaning machine and then drying, 50 per piece One batch was inserted into a quartz boat, pushed into an oxidation furnace and oxidized with chlorine at 1050°C for 120 minutes, with a growth thickness of 7000 Ȧ±300 Ȧ. After coming out of the furnace, use a glue coater to spin-coat the negative glue, and perform photolithography on the P-zone window on the photolithography machine. The window area is 3.68×3.68 mm, remove the glue, wash and dry, insert a quartz boat, and push it into the oxidation furnace at 900 ° C. Under dry oxygen oxidation for 30 minutes, the growth thickness is 250 Ȧ±50 Ȧ. Implant boron ions on silicon wafers on an ion implanter with an implant energy of 60KeV and an implant dose of 6E14 / cm 2 , t...
PUM
Property | Measurement | Unit |
---|---|---|
thickness | aaaaa | aaaaa |
diameter | aaaaa | aaaaa |
height | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com