Capacitor material with metal component for use in circuitized substrates, circuitized substrate utilizing same, method of making said circuitized substrate, and information handling system utilizing said circuitized substrate

a technology of circuitized substrates and capacitors, which is applied in the direction of fixed capacitors, connection contact materials, printed capacitor incorporation, etc., can solve the problems of inability of the dielectric layer to withstand substantial voltage, obstacles to the formation of thru-holes, and further undesirable effects

Inactive Publication Date: 2006-07-13
I3 ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0031] It is, therefore, a primary object of the present invention to enhance the circuitized substrate art by providing a circuitized substrate having the advantageous features taught herein, including a new and unique material that may be used as an internal capacitor material within the substrate.
[0032] It is another object of the invention to provide a method of making such a circuitized substrate which can be accomplished in a relatively facile manner and at relatively low costs.

Problems solved by technology

The discrete passive devices occupy a high percentage of the surface area of the completed substrate, which is undesirable from a future design aspect because of the increased need and demand for miniaturization in today's substrates and products containing same art.
Some of the patents listed below, particularly U.S. Pat. No. 5,162,977, mention use of various materials for providing desired capacitance levels under this formula, and many mention or suggest problems associated with the methods and resulting materials used to do so.
Use of pre-fired and ground ceramic nano-powders in the dielectric layer poses obstacles for the formation of thru-holes (conductive holes permitting electronic communication between conductive layers of a PCB), however.
The distribution within the dielectric layer of particles of different size often presents major obstacles to thru-hole formation where the thru-holes are of extremely small diameter, also referred to in the industry as micro-vias due to the presence of the larger particles.
Another problem associated with pre-fired ceramic nano-powders is the ability for the dielectric layer to withstand substantial voltage without breakdown occurring across the layer.
This is even further undesirable because, as indicated by the equation cited above, greater planar capacitance may also be achieved by reducing the thickness of the dielectric layer.
That is, the resulting PCB still requires the utilization of external devices thereon, and thus does not afford the PCB external surface area real estate savings mentioned above which are desired and demanded in today's technology.
Although the pre-fired and ground dielectric formulations produced by solid phase reactions are acceptable for many electrical applications, these suffer from several disadvantages.
First, the milling step serves as a source of contaminants, which can adversely affect electrical properties.
Second, the milled product consists of irregularly shaped fractured aggregates which are often too large in size and possess a wide particle size distribution, 500-20,000 nm.
Consequently, films produced using these powders are limited to thicknesses greater than the size of the largest particle.
Thirdly, powder suspensions or composites produced using pre-fired ground ceramic powders must be used immediately after dispersion, due to the high sedimentation rates associated with large particles.
It is thus clear that methods of making PCBs which rely on the advantageous features of using nano-powders as part of the PCB's internal components or the like, such as those described in selected ones of the above patents, possess various undesirable aspects which are detrimental to providing a PCB with optimal functioning capabilities when it comes to internal capacitance or other electrical operation.

Method used

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  • Capacitor material with metal component for use in circuitized substrates, circuitized substrate utilizing same, method of making said circuitized substrate, and information handling system utilizing said circuitized substrate
  • Capacitor material with metal component for use in circuitized substrates, circuitized substrate utilizing same, method of making said circuitized substrate, and information handling system utilizing said circuitized substrate
  • Capacitor material with metal component for use in circuitized substrates, circuitized substrate utilizing same, method of making said circuitized substrate, and information handling system utilizing said circuitized substrate

Examples

Experimental program
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Effect test

example one

[0063] 38.5 grams (gm) of an epoxy novolac resin sold under the product name “LZ 8213” from Huntsman, Salt Lake City, Utah, containing about 35 wt % methyl ethyl ketone and 6.5 gm of a phenoxy resin sold under the product name “PKHC” from Phenoxy Associates, Rock Hill, S.C., containing 50 wt % methyl ethyl ketone were mixed together with 100 gm of barium titanate (BaTiO3) powder available from Cabot Corporation, Boyertown, Pa. ((50 gm BaTiO3 with mean particle size=0.065 micron, surface area=16 m2 / gm) and (50 gm BaTiO3 with mean particle size=0.12 micron, surface area=8.2 m2 / gm)), 13 gm propylene glycol methyl ether acetate) and 12 gm methyl ethyl ketone) and ball milled for 3 days. After 3 days of ball milling, an homogeneous slurry was observed. 50 gm of this mixed slurry was mixed with 20 gm silver nano-powders available from Cima NanoTech, Inc., North Industrial Park, Caesarea, Israel, having a D90 particle size of 0.07 micron (D90 meaning 90% of the particles have a diameter le...

example two

[0064] 30.7 gm of “LZ 8213” epoxy novolac resin containing about 35 wt % methyl ethyl ketone and 5.3 gm of “PKHC” phenoxy resin containing 50 wt % methyl ethyl ketone were mixed together with 100 gm of Cabot barium titanate having a mean particle size of 0.12 micron and particle surface area of about 8.2 m2 / gm, 12 gm propylene glycol methyl ether acetate and 15 gm methyl ethyl ketone, and ball milled for 3 days until a homogeneous slurry was observed. 51.6 gm of this mixed slurry was then mixed with 5.1 gm of Cima NanoTech's silver nano-powders having a D90 particle size of 0.07 micron and 10 gm methyl ethyl ketone and ball milled for 5 days. A thin film of this mixed composite was then deposited on a copper substrate and dried at approximately 140° C. for 3 minutes in an oven to remove residual organic solvents. This was followed by curing in an oven at 190° C. for 2 hours. A second electrical conductor was then formed using a sputtering operation atop the cured film using a mask n...

example three

[0065] 30.7 gm of “LZ 8213” epoxy novolac resin containing about 35 wt % methyl ethyl ketone and 5.3 gm of“PKHC” phenoxy resin containing 50 wt % methyl ethyl ketone were mixed together with 100 gm of Cabot barium titanate having a mean particle size of 0.12 micron and particle surface area of about 8.2 m2 / gm, 12 gm propylene glycol methyl ether acetate and 15 gm methyl ethyl ketone, and ball milled for 3 days until a homogeneous slurry was observed. 30.5 gm of this mixed slurry was mixed with 10.4 gm of Cima NanoTech's silver nano-powders having a D90 particle size of 0.07 micron and 10 gm methyl ethyl ketone and ball milled for 5 days. A thin film of this mixed composite was then deposited on a copper substrate and dried at approximately 140° C. for 3 minutes in an oven to remove residual organic solvents. This was followed by curing in an oven at 190° C. for 2 hours. A second electrical conductor was then formed using a sputtering operation atop the cured film using a mask normal...

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Abstract

A material for use as part of an internal capacitor within a circuitized substrate includes a polymer resin and a quantity of nano-powders including a mixture of at least one metal component and at least one ferroelectric ceramic component, the ferroelectric ceramic component nano-particles having a particle size substantially in the range of between about 0.01 microns and about 0.9 microns and a surface within the range of from about 2.0 to about 20 square meters per gram. A circuitized substrate adapted for using such a material and capacitor therein and a method of making such a substrate are also provided. An electrical, assembly (substrate and at least one electrical component) and an information handling system (e.g., personal computer) are also provided.

Description

CROSS REFERENCE TO CO-PENDING APPLICATIONS [0001] This is a divisional application of Ser. No. 11 / 031,074, filed Jan. 10, 2005.TECHNICAL FIELD [0002] The present invention relates to providing capacitors within circuitized substrates such as printed circuit boards, chip carriers and the like, and more specifically to a method for doing so and to products including such internal components as part thereof. Even more particularly, the invention relates to such methodologies and products wherein the capacitors are comprised of nano-powders. [0003] In Ser. No. 11 / 031,085, entitled “Capacitor Material For Use In Circuitized Substrates, Circuitized Substrate Utilizing Same, Method of Making Said Circuitized Substrate, And Information Handling System Utilizing Said Circuitized Substrate”, also filed Jan. 10, 2005 (inventors: J. Lauffer et al), there is defined a material for use as part of an internal capacitor within a circuitized substrate wherein the material includes a polymer resin an...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H01R4/58
CPCH01G4/206H01L2224/16H01L2224/73253H01L2924/0102H01L2924/01025H01L2924/01046H01L2924/01057H01L2924/01078H01L2924/01079H01L2924/15311H01L2924/16195H01L2924/3011H05K1/162H05K3/0023H05K2201/0187H05K2201/0209H05K2201/0215H05K2201/0257H01L2924/01087H01L2924/00014H01L2924/00011H01L2224/0401
Inventor DAS, RABINDRA N.LAUFFER, JOHN M.MARKOVICH, VOYA R.POLIKS, MARK D.
Owner I3 ELECTRONICS
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