Architecture and method for remote memory system diagnostic and optimization

Abstract

A smart memory system preferably includes a memory including one or more memory chips and a smart memory controller. The smart memory controller includes a transmitter communicatively coupled to the cloud. The transmitter securely transmits a product identification (ID) associated with the memory to the cloud. A cloud-based data center receives and stores the product ID and related information associated with the memory. A smart memory tester receives a product specific test program from the cloud-based data center. The smart memory tester may remotely test the memory via the cloud in accordance with the product specific test program. The information stored in the cloud-based data center can be accessed anywhere in the world by authorized personnel. Repair solutions can be remotely determined based on the test results and the diagnostic information. The repair solutions are transmitted to the smart memory controller, which repairs the memory.

Description

CROSS-REFERENCES TO RELATED APPLICATIONS[0001]This application claims the benefit of commonly assigned provisional application Ser. No. 61 / 597,773, filed Feb. 11, 2012, entitled “A METHOD AND SYSTEM FOR PROVIDING A SMART MEMORY ARCHITECTURE,” the contents of which is incorporated herein by reference in its entirety.BACKGROUND[0002]The present inventive concepts relate to a smart memory architecture, and more particularly to an architecture and method for remotely diagnosing and optimizing memory systems.[0003]The present inventive concepts relate to memory systems for storing and retrieving information from memory integrated circuits, including static random access memory (SRAM), dynamic random access memory (DRAM), Flash memory, phase-change random access memory (PCRAM), spin-transfer torque random access memory (STT-RAM), magnetic random access memory (MRAM), resistive random access memory (RRAM), and future memory devices. Inventive aspects described herein are particularly well-...

AI Technical Summary

Benefits of technology

The present invention is about a smart memory system that can be connected to a remote system enhancement and recovery entity through a secure cloud connection. The system can be accessed and optimized anytime, and anywhere the device has cloud access. It can facilitate real-time diagnosis and repair by a remotely-located application engineer or other entity. The system uses low latency and high throughput SiP interconnects to provide improved system performance and minimize cost disadvantages. It also reduces power consumption by reducing I / O loading, providing clock-less memory operation, and shutting down unused memory sections. The device processor can offload repetitive computations or other tasks to the smart memory system. The system monitors, repairs, corrects, and re-assigns memory according to principles of the present invention. The smart memory controller and remotely according to the principles of the present invention. The system uses error correction technologies to enhance data stability and reduce error rates.

Problems solved by technology

Unfortunately, with STT-RAM or any other type of memory chip, manufacturing or other defects may result in not all memory cells on a memory chip functioning properly.

Memory repair is not made available to the memory's end-user.

Due to the relatively high error rates and probabilistic tendencies of memories such as PCRAM, MRAM, and RRAM devices, the conventional approaches to detecting and solving memory defects are inadequate.

Once in the field, it is difficult or impossible to fully diagnose and apply repair solutions to the memory systems.

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