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Method of manufacturing magnetoresistive element and manufacturing system for the same

a manufacturing system and technology of magnetoresistive elements, applied in the field of manufacturing methods of magnetoresistive elements and manufacturing systems of the same, can solve the problems of not being able to meet the requirements of reality, the degree of downscaling to be achieved in the manufacturing of mrams, for example, is greatly different, and achieves high magnetic properties , the effect of increasing the degree of integration of the magnetoresistive elemen

Inactive Publication Date: 2016-07-14
CANON ANELVA CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The invention described in this patent aims to improve the magnetic properties of a magnetoresistive element by removing a damage layer, which will increase its yield. The goal is to create a magnetoresistive element that can be further downscaled and still maintain strong magnetic properties. The invention provides a method and system for manufacturing such an element.

Problems solved by technology

Today, however, a degree of downscaling to be achieved in the manufacturing of MRAMs, for example, is greatly different from that in 2007 when Patent Document 1 was disclosed.
Nowadays, the manufacturing of MRAMs is required to achieve a degree of integration about 16 times higher than that in 2007, and the technique disclosed in Patent Document 1 is not necessarily sufficient to meet such requirements in reality.

Method used

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  • Method of manufacturing magnetoresistive element and manufacturing system for the same
  • Method of manufacturing magnetoresistive element and manufacturing system for the same
  • Method of manufacturing magnetoresistive element and manufacturing system for the same

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Embodiment Construction

[0035]Hereinafter, an embodiment of the present invention is described with reference to the drawings. It should be noted that the present invention is not limited to the embodiment described herein, but may be modified as necessary without departing from the spirit of the present invention.

[0036]FIG. 1 presents steps to be executed in a method of manufacturing a magnetoresistive element according to this embodiment. Note that this embodiment is described for a case of manufacturing a tunneling magnetoresistive (TMR) element as a magnetoresistive element. The method of manufacturing a magnetoresistive element according to this embodiment includes steps S121, S122, S123, and S124 which are executed sequentially in this order as presented in FIG. 1.

[0037]Step S121 is a step of preparing a stacked film formed on a substrate, the stacked film including two magnetic layers between which a layer to function as a tunnel barrier layer is held.

[0038]In general, step S121 is the step of obtai...

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Abstract

Provided are a method of manufacturing a magnetoresistive element and a manufacturing system which are capable of manufacturing a magnetoresistive element achieving further downscaling, i.e., further increase in the degree of integration of the magnetoresistive element while having high magnetic properties. The method includes: preparing a stacked film including one of the two magnetic layers, a layer to form the tunnel barrier layer, and the other of the two magnetic layers, on a substrate; forming multiple separated stacked films on the substrate by separating the stacked film into the multiple stacked films by etching; irradiating side portions of the multiple separated stacked films with ion beams in a pressure-reducible process chamber; and after the irradiation with the ion beams, forming oxide layers or nitride layers on surfaces of the multiple stacked films by introducing an oxidizing gas or a nitriding gas into the process chamber.

Description

CROSS-REFERENCES TO RELATED APPLICATIONS[0001]This application is a continuation application of International Application No. PCT / JP2014 / 002210, filed Apr. 18, 2014, which claims the benefit of Japanese Patent Application No. 2013-197982 filed Sep. 25, 2013. The contents of the aforementioned applications are incorporated herein by reference in their entireties.TECHNICAL FIELD[0002]The present invention relates to a method of manufacturing a magnetoresistive element, and a manufacturing system for the same.BACKGROUND ART[0003]A magnetic random access memory (MRAM) is a non-volatile memory including tunneling magnetoresistive (TMR) elements utilizing tunneling magnetoresistive effect. The MRAM has been drawing attention as a revolutionary next-generation memory which makes it possible to rewrite data without limitation while achieving as high integration density as the dynamic random access memory (DRAM) and as high speed as the static random access memory (SRAM).[0004]The TMR elemen...

Claims

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Application Information

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IPC IPC(8): H01L43/12H01L43/08H01L43/10H01L43/02
CPCH01L43/12H01L43/10H01L43/08H01L43/02H10N50/10H10N50/01H10N50/80H10N50/85H10B61/22G11C11/161G11C11/1673G11C11/1675
Inventor HAYASHI, MARIESAKAMOTO, KIYOTAKAIKEDA, MASAYOSHI
Owner CANON ANELVA CORP