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Laser induction atomic emission spectrum investigating system and method of time resolution

It is an atomic emission spectroscopy and time-resolved technology, which is applied in material excitation analysis, special data processing applications, instruments, etc. It can solve the problems of increasing system volume and cost, complicated coordination process, and reducing work efficiency, etc., to achieve volume reduction and The effect of weight, avoiding the influence of unstable time interval factors, and simplifying the system structure

Active Publication Date: 2007-12-19
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0004] Although the existing detection system can complete the spectral detection work in the laboratory or in the field under manual operation conditions, the discrete converging / receiving optical system in the system can detect the target object without contact when two sets of optical systems are used. The coordinated focusing process of the system is complicated and the accuracy is not high, which reduces the work efficiency; the synchronization signal is generally taken from the output electrical signal of the laser system, and there is a time difference between the output pulse of the laser; the external time delay control device increases the volume and cost of the system, and it needs These shortcomings make it difficult for existing equipment to play a role in unmanned and highly automated applications such as deep space exploration in the future.

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  • Laser induction atomic emission spectrum investigating system and method of time resolution

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Embodiment Construction

[0022] In the system shown in Figure 1, the laser 1 is a Nd:YAG Q-switched pulsed laser, the working wavelength is 1064nm, the pulse width is about 7ns, the maximum pulse energy is 200mJ, the pulse energy stability is ±2%, and the laser beam divergence angle is less than 1mrad. The laser beam emitted by the laser is used to excite the sample to be tested to generate a plasma emission spectrum.

[0023] The output pulse of the laser 1 first passes through a beam splitter 2 that forms an angle of 45° with the laser beam. Please refer to Fig. 2 and Fig. 1, a small part of laser energy can be refracted from the laser pulse and incident into the photodiode 501, The photodiode 501 usually chooses a photoconductive type with high-speed response capability, and the rising edge can generally reach several nanoseconds; it is recommended to use a high-bandwidth operational amplifier 502, and the amplification gain is generally set to 5 to 10 times. The output of the amplifier 502 Compare...

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Abstract

A spectrum detection system with time resolution in laser induced atom emission type is prepared as using converging / receiving common optical unit to simplify system structure and system-focusing link, using laser outgoing pulse as reference synchronous signal to realize high accuracy of time, utilizing CCD image transducer with overflow channel to realize time resolution function being able to be adjusted on microsecond grade, using up-level computer to control system parameter and to realize data communication through USB controller.

Description

Technical field: [0001] The invention relates to a laser-induced atomic emission spectrum detection system with time-resolution characteristics, belonging to the technical fields of spectrum detection and photoelectric detection. Background technique: [0002] Laser-induced atomic emission spectroscopy technology was born in the middle and late 20th century. According to the principle of the interaction between laser and matter, laser pulses are used to ionize the surface of matter at high temperatures to generate plasma emission spectra, which are converted into electrical signals. According to the established electrical signals It can qualitatively and quantitatively analyze the content of substances. It is a technical means that can realize simultaneous detection of multiple elements and quantitative measurement and analysis of component content. It is non-destructive and non-contact, and does not require sampling. And sample pretreatment, multi-element simultaneity, on-s...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/63G06F17/00
Inventor 王建宇马德敏舒嵘何志平亓洪兴吕刚忻松筠
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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