Plasma processing apparatus
A plasma and processing device technology, applied in the field of plasma processing devices, can solve problems such as inability to perform uniform processing
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Embodiment 1
[0041] FIG. 1 is a cross-sectional view showing a first embodiment of the plasma processing apparatus of the present invention. FIG. 2 is a sectional view along A-A in FIG. 1 , and FIG. 3 is a sectional view along B-B in FIG. 1 .
[0042] The vacuum container 101 is made of aluminum, for example, and is grounded. Inside the vacuum vessel 101 , a substrate 107 and a substrate mounting table 108 are provided. The substrate 107 is, for example, a glass substrate. Bellows 109 are provided between the mounting table 108 and the vacuum vessel 101 , and the mounting table 108 can be raised and lowered while maintaining the airtight state by a lifting mechanism not shown. A lower portion of the vacuum container 101 is provided with an exhaust port 110 for exhausting gas inside the vacuum container 101 by a vacuum pump provided outside the vacuum container 101 .
[0043] The two rectangular waveguides 102 are arranged parallel to each other, that is, the H plane (the wide wall surfa...
Embodiment 2
[0085] Fig. 9 is a cross-sectional view showing a second embodiment of the plasma processing apparatus of the present invention. Here, only the points of difference from the first embodiment will be described.
[0086] On the surface of the waveguide 102 on the mounting table 108 side, a rectangular parallelepiped dielectric plate 104 is arranged for each slit 103 . Furthermore, a structure may be adopted in which the dielectric plates 104 are arranged across the plurality of waveguides 102 .
[0087] A waveguide inner dielectric 201 is provided inside the waveguide 102 . The dielectric body 201 in the waveguide is made of a fluororesin with a specific permittivity of 2.1, but may be quartz, mullite, alumina, sapphire, yttrium oxide, aluminum nitride, silicon nitride, or the like. In this way, when a dielectric is inserted into the waveguide, the cross-sectional size of the waveguide and the wavelength λg inside the waveguide are reduced. If the specific permittivity of the...
Embodiment 3
[0095] Fig. 11 is a cross-sectional view showing a third embodiment of the plasma processing apparatus of the present invention. Fig. 12 is a sectional view of A-A in Fig. 11 . Here, only the points of difference from the first embodiment will be described.
[0096] A single rectangular waveguide 301 is arranged such that the E plane (narrow wall surface of the rectangular waveguide) is parallel to the substrate 107 . One end of the waveguide 301 is a short-circuit surface, and the other end is connected to the microwave supply system 113 . In this embodiment, since elongated plasma can be generated, it is suitable for plasma processing of elongated members and plasma processing while moving a large-area substrate in a direction perpendicular to the waveguide axis.
[0097] A plurality of slits 103 are opened at equal intervals on the surface of the waveguide 301 on the side of the mounting table 108 . On the surface of the waveguide 301 on the side of the mounting table, a...
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