High power density laser sputtering ionization time-of-flight mass spectrometer and use thereof

A technology of time-of-flight mass spectrometry and high power density, applied in the field of mass spectrometers, can solve the problems that mass spectrometers cannot meet the adaptability requirements, reduce the resolving power of the instrument, and cannot effectively separate ions, etc. Less destructive, character-changing effects
CN101465261AInactive Publication Date: 2009-06-24XIAMEN UNIV

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
XIAMEN UNIV
Publication Date
2009-06-24
Estimated Expiration
Not applicable · inactive patent

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Abstract

A high-power density laser sputtering ionization flying time mass spectrometer and the application thereof relate to a mass spectrometer. A high-power density laser sputtering ionization flying time mass spectrometer and the application thereof are provided. The high-power density laser sputtering ionization flying time mass spectrometer is provided with a vacuum chamber, a laser source, a laser-focusing lens, a sampling cone, an ion transmission device, an interception cone and a flying time mass analyzer; the laser source and the laser-focusing lens are arranged outside the vacuum chamber; besides, the sampling cone, the ion transmission device, the interception cone and the flying time mass analyzer are sequentially arranged in the vacuum chamber. The vacuum chamber is provided with a third-level vacuum chamber; a first-level vacuum chamber is arranged in front of the sampling cone; a second-level vacuum chamber is arranged between the sampling cone and the interception cone; and the third-level vacuum chamber is arranged behind the interception cone. Through the collision with the auxiliary gas molecules (atoms) in the ion source, the kinetic energy of the sample irons is reduced to facilitate sampling and transmission; the multivalent ions lose valences and are converted into polyvalent ions to remove the interference peak of multivalent ions, so that the spectrum is clear and easy to read and has strong distinguishing ability.
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Description

technical field

[0001] The invention relates to a mass spectrometer, in particular to a high power density laser sputtering ionization time-of-flight mass spectrometer for direct analysis of solids without standard samples and its application. Background technique

[0002] The analysis of elements in solid samples plays an important role in the fields of metallurgy, geology, mining, environmental protection, national defense, and semiconductor industry. Solid samples are usually dissolved and digested with strong acid, and then detected by atomic spectroscopy or mass spectrometry. In recent years, direct analysis methods of solid samples have attracted more and more attention. Compared with solid dissolution analysis, direct analysis can save a lot of sample preparation time, especially in the case of solid samples that are difficult to dissolve or highly toxic. In addition, the direct analysis of solid samples can not only avoid the loss and pollution during the dissolutio...

Claims

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