High power density laser sputtering ionization time-of-flight mass spectrometer and use thereof
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- XIAMEN UNIV
- Publication Date
- 2009-06-24
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a mass spectrometer, in particular to a high power density laser sputtering ionization time-of-flight mass spectrometer for direct analysis of solids without standard samples and its application. Background technique
[0002] The analysis of elements in solid samples plays an important role in the fields of metallurgy, geology, mining, environmental protection, national defense, and semiconductor industry. Solid samples are usually dissolved and digested with strong acid, and then detected by atomic spectroscopy or mass spectrometry. In recent years, direct analysis methods of solid samples have attracted more and more attention. Compared with solid dissolution analysis, direct analysis can save a lot of sample preparation time, especially in the case of solid samples that are difficult to dissolve or highly toxic. In addition, the direct analysis of solid samples can not only avoid the loss and pollution during the dissolutio...