Multi-layered thickness eddy current testing device based on giant magnetoresistance sensor and intelligent algorithm

A giant magnetoresistive sensor and intelligent algorithm technology, applied in the field of multi-layer thickness eddy current detection devices, can solve the problems of insufficient sensitivity and spatial resolution, difficulty in the application of multi-layer materials, surface and sub-surface defect detection, etc., to achieve confidence The effect of high noise ratio, low power consumption and low cost

Inactive Publication Date: 2009-09-16
ZHEJIANG UNIV
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  • Abstract
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Problems solved by technology

However, conventional eddy current detectors use ordinary coils as the detection sensor, which can solve some problems such as single-layer thickness measurement and surface and subsurface defect detection, but it is difficult to apply to the thickness of multi-layer materials or the detection of deep defects. The main reason is that the sensitivity and spatial resolution of the coil sensor are not high enough for the thickness of multi-layer materials or deep defects

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  • Multi-layered thickness eddy current testing device based on giant magnetoresistance sensor and intelligent algorithm
  • Multi-layered thickness eddy current testing device based on giant magnetoresistance sensor and intelligent algorithm
  • Multi-layered thickness eddy current testing device based on giant magnetoresistance sensor and intelligent algorithm

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Embodiment Construction

[0017] like figure 1 As shown in the figure, the single-chip microcomputer system in the multi-layer thickness eddy current detection device based on the giant magnetoresistive sensor and the intelligent algorithm is respectively connected with the computer, liquid crystal display, keyboard and program-controlled amplifier, and the single-chip computer system is connected with the signal generator, power amplifier and excitation coil in turn. The detection coil is connected with the detection circuit and the program-controlled amplifier in turn. Both the excitation coil and the detection coil are wound on the giant magnetoresistive chip and the magnetic steel.

[0018] like figure 2 As shown, the signal generator circuit is: the first pin of the AD9833 chip is connected to the power supply VDD through the fourth capacitor, the second pin of the AD9833 is connected to the power supply VDD, and is grounded through the first capacitor, and the third pin of the AD9833 is connect...

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Abstract

The invention discloses a multi-layered thickness eddy current testing device based on a giant magnetoresistance sensor and an intelligent algorithm. The device generates actuating signals via a signal generator, and provides the actuating signals for built-in GMR and drive coil of magnetic steel after the signals are amplified by a power amplifier. The device detects the magnitude of the eddy current signals based on the built-in GMR and the drive coil of the magnetic steel, and the signals are sent to an amplifying circuit for being amplified after being tested by a detection circuit. The output of the amplifying circuit is collected to a computer by a data acquisition circuit based on a single chip microcomputer to be processed. The signal has a close relation with the thickness of the detected multi-layered conducting materials, carries out back calculation after adopting an improved BP network and can obtain the thickness of the conducting materials of each layer. The device is applicable to the thickness testing of multi-layered conducting structure in fields of machine, printed circuit board, aerospace, national defense and the like.

Description

technical field [0001] The invention relates to a multi-layer thickness eddy current detection device based on a giant magnetoresistive sensor and an intelligent algorithm. Background technique [0002] In the fields of petroleum, chemical industry, metallurgy, shipbuilding, PCB production, aviation, aerospace and other fields, it is necessary to measure various plates and various processed parts, or to monitor various pipes and pressure vessels in production equipment, and to measure multilayer conductive materials. thickness, or to detect their thinning after being corroded during use. Therefore, thickness detection has a very broad application market. The commonly used thickness detection methods mainly include ultrasonic thickness measurement, ray thickness measurement, magnetic thickness measurement, laser thickness measurement and eddy current thickness measurement. The ultrasonic thickness measurement method is affected by factors such as the surface roughness of th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B7/06G06N3/02
Inventor 周泽魁李国厚黄平捷候迪波张光新陈佩华高扬华蔡文范孟豹叶波
Owner ZHEJIANG UNIV
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