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Preparation method for hydrogenated crystalline state nanometer carborundum films under low temperature

A technology of silicon carbide and nanocrystals, applied in the direction of gaseous chemical plating, metal material coating process, coating, etc., can solve problems affecting film properties, defects, high stress and lattice, and achieve the effect of avoiding damage

Inactive Publication Date: 2010-08-18
HEBEI UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Such a high substrate temperature can cause self-doping of the film, redistribution of dopants, high stress, and lattice defects, which can seriously affect the properties of the film
[0004] At present, there is still no literature report on the application of helicon wave plasma enhanced chemical vapor deposition method to grow hydrogenated nanocrystalline silicon carbide film, especially single crystal or polycrystalline cubic silicon carbide film at a lower substrate temperature.

Method used

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  • Preparation method for hydrogenated crystalline state nanometer carborundum films under low temperature
  • Preparation method for hydrogenated crystalline state nanometer carborundum films under low temperature
  • Preparation method for hydrogenated crystalline state nanometer carborundum films under low temperature

Examples

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Embodiment 1

[0025] The method for preparing a hydrogenated nanocrystalline silicon carbide film at a low temperature according to the first embodiment of the present invention comprises the following steps:

[0026] A. Take a single crystal silicon wafer substrate, clean it in an ultrasonic cleaner for 3 minutes with a mixture of acetone and methanol, then dry it, and then use a volume ratio NH 4 OH:H 2 o 2 :H 2 O=1:2:5 mixed solution soaked for 5 minutes, took out and rinsed with deionized water, and then put in the volume ratio HF:H 2 Soak in the mixed solution of O=1:10 for 1 minute, take it out and rinse it with deionized water, dry it and place it on the substrate stage of the helicon wave plasma enhanced chemical vapor deposition device;

[0027] B. Use the vacuum pumping system of the helicon wave plasma enhanced chemical vapor deposition device to evacuate the reaction chamber until the pressure in the reaction chamber is lower than 1×10 -4 Pa;

[0028] C. Pass hydrogen gas w...

Embodiment 2

[0032]The method for preparing a hydrogenated nanocrystalline silicon carbide film at a low temperature in the second embodiment of the present invention has the same steps as in the embodiment 1, except that the substrate stage is heated to 300° C. in step 1-D.

Embodiment 3

[0034] The method for preparing a hydrogenated nanocrystalline silicon carbide film at a low temperature in the third embodiment of the present invention has the same steps as in the embodiment 1, except that the substrate stage is heated to 400° C. in step 1-D.

[0035] Embodiment 1-3 has adopted different substrate temperature, figure 1 The FTIR spectra of the hydrogenated nanocrystalline silicon carbide films obtained in Examples 1-3 are given, from which it can be seen that the absorption peaks associated with the Si-C stretching mode are respectively located at 793-798cm -1 Nearby, using the deconvolution method, for the three films at 500-1200cm -1 The absorption bands within the range are deconvoluted, and it is found that they all need Lorentzian peaks to fit the spectral lines, and the crystallinity increases significantly with the increase of the substrate temperature. The results show that the deposition of hydrogenated nanocrystalline silicon carbide films can be ...

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Abstract

The invention discloses a preparation method for hydrogenated crystalline state nanometer carborundum films under low temperature. The method comprises the following steps: first, placing the rinsed substratum on the substrate plate of the chemical vapor deposition device strengthened by helicon plasma, and then vacuumizing the reaction chamber of the chemical vapor deposition device strengthened by helicon plasma, and rinsing the substrate plate and the internal walls of the chamber by hydrogen plasma; then, reheating the substrate plate and inflating reaction gas into the reaction chamber to adjust the air pressure, and applying magnetic field to the plasma production chamber of the chemical vapor deposition device strengthened by helicon plasma, and turning on the RF power supply to start the deposition of carborundum films to obtain the carborundum films sample; finally, cooling the chamber off to room temperature under the protection of hydrogen and taking out the sample from the chamber to complete the deposition of hydrogenated nanometer crystalline state nanometer carborundum films. Hydrogenated nanometer crystalline state nanometer carborundum films can be prepared by using the method of the invention under a low temperature.

Description

technical field [0001] The invention relates to the field of thin film preparation, especially a method for preparing a hydrogenated nanocrystalline silicon carbide thin film by using a helicon wave plasma-enhanced chemical vapor deposition method under low temperature conditions Background technique [0002] Cubic silicon carbide has great potential in high-frequency, high-power, high-temperature-resistant and radiation-resistant microelectronics and optoelectronic devices due to its wide bandgap, large electron saturation drift rate, high critical avalanche breakdown electric field and high thermal conductivity. Value. In addition, the cubic silicon carbide film, as a silicon-based film, also has broad application prospects in the thin-film solar cell industry. [0003] Since the crystallization of silicon carbide is very difficult under the condition of relatively low substrate temperature, under the background of the existing technology, high-quality cubic silicon carbi...

Claims

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Application Information

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IPC IPC(8): C23C16/32C23C16/455
Inventor 于威路万兵傅广生王春生崔双魁
Owner HEBEI UNIVERSITY
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