Chemical mechanical polishing solution
A chemical-mechanical and polishing liquid technology, applied in electrical components, semiconductor/solid-state device manufacturing, circuits, etc., can solve problems such as limited pH adjustment ability, low polishing liquid pH, equipment corrosion, etc., to reduce the content of organic matter, Wide pH adjustment range, the effect of reducing corrosion of equipment
Active Publication Date: 2014-09-24
ANJI MICROELECTRONICS (SHANGHAI) CO LTD
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Problems solved by technology
However, due to the introduction of organic acids, the pH of the polishing solution is low (usually lower than about 2.7), causing equipment corrosion
Because when the pH value is higher than 2.7, ferric nitrate will be hydrolyzed to form ferric hydroxide precipitate, which will cause the polishing fluid to fail and limit its pH adjustment ability
In terms of environmental protection, due to the addition of organic acids, the organic content (COD) in the polishing waste liquid is increased, which is not conducive to environmental protection
Although organic acid is added as a stabilizer to improve the decomposition rate of hydrogen peroxide, its decomposition rate is still high. Usually, the concentration of hydrogen peroxide will decrease by more than 10% within two weeks, resulting in a decrease in polishing speed and gradual decomposition of the polishing solution.
[0013] Chinese patent CN1966594A discloses a method of adding an etch inhibitor to the above catalytic system, but since the catalyst used is still iron, problems such as easy decomposition of hydrogen peroxide and poor stability still exist
[0018] Among the above-mentioned 3 patents, the combination of silver and hydrogen peroxide (for example, hydrogen peroxide plus silver nitrate) does not have the effect of significantly increasing the polishing speed of tungsten, and only the combination of iron and hydrogen peroxide can significantly improve the polishing speed of tungsten, (the above three The examples of the patent itself demonstrate both of these points)
Method used
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Embodiment 18 and 19
[0052]
[0053] The data in Table 3 are the tungsten polishing rates of the chemical mechanical polishing fluid examples 18 and 19 of the present invention on industrial machines. The result shows that the chemical mechanical polishing fluid of the present invention can realize very high polishing speed on industrial equipment.
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Abstract
Description
technical field [0001] The invention relates to a chemical mechanical polishing liquid, in particular to a chemical mechanical polishing liquid containing an activator and a strong oxidizing agent precursor. The present invention further relates to using the chemical mechanical polishing liquid described in the present invention in tungsten chemical mechanical polishing. Background technique [0002] With the continuous development of semiconductor technology and the continuous increase of interconnection layers in large-scale integrated circuits, the planarization technology of conductive layers and insulating dielectric layers has become particularly critical. In the 1980s, the chemical mechanical polishing (CMP) technology pioneered by IBM is considered to be the most effective method for global planarization. [0003] Chemical Mechanical Polishing (CMP) consists of chemical action, mechanical action, and a combination of both. It usually consists of a grinding table wi...
Claims
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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/304
Inventor 王晨何华锋
Owner ANJI MICROELECTRONICS (SHANGHAI) CO LTD
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