Preparation method of target-grade ultrahigh-purity tantalum metal

An ultra-high and target technology, which is applied in the field of target-grade ultra-high-purity tantalum metal production, can solve problems such as deterioration of interface characteristics, complex mineral composition, and influence on component actions, so as to reduce production costs and save refining times Effect

Active Publication Date: 2012-03-21
稀美资源(广东)有限公司
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AI Technical Summary

Problems solved by technology

One is that the tantalum metal is not pure enough
Practice has proved that high alkali metals such as K and Na in tantalum will cause the movement of semiconductor insulating film and deteriorate the interface characteristics; high transition elements such as Fe, Cr, Ni, Mn, etc. will affect the operation of components; high radioactive impurities such as Th and U , the emitted rays have a fatal impact on the reliability of components; high refractory metals such as Nb, W, Mo, and Zr increase the leakage current of components; high gas impurities such as C and O affect the electrical properties of components
[0005] The second is the high cost of electron beam refining. In order to ensure the purity of tantalum metal, tantalum ingots are usually refined 2 to 3 times, or even more times,...

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  • Preparation method of target-grade ultrahigh-purity tantalum metal
  • Preparation method of target-grade ultrahigh-purity tantalum metal

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Embodiment Construction

[0023] The invention provides a preparation method of target-grade ultra-high-purity tantalum metal. The basic steps of the method are as follows:

[0024] 1) For industrial grade potassium fluorotantalate K 2 TaF 7 Recrystallization and purification by wet smelting. The process route is to dissolve industrial grade K with hydrofluoric acid HF solution. 2 TaF 7 , add potassium ion solution in excess according to the theoretical amount, so that K 2 TaF 7 Recrystallization, the K 2 TaF 7 The recrystallized body is washed with alkali and dried to obtain slightly acidic K 2 TaF 7 Crystals;

[0025] 2) For the slightly acidic K obtained 2 TaF 7 The crystal is reduced by fire smelting, and the process route is to convert K 2 TaF 7 The crystal is reduced to tantalum powder with sodium Na, and then washed with water, pickled and heat treated to obtain ultra-high-purity tantalum powder.

[0026] Wherein, the pair of industrial grade potassium fluorotantalate K 2 TaF 7The...

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Abstract

The invention provides a preparation method of target-grade ultrahigh-purity tantalum metal. In the method, a recrystallization process is added in tantalum wet-process metallurgy, thereby effectively reducing the contents of high-melting-point metal impurities and radioactive elements. The preparation method comprises: industrial K2TaF7 is put in a pure diluted HF solution, the concentration of crystalline HF is controlled, the temperature of crystalline HF is controlled to 80-90 DEG C, and potassium salt is excessive by 5-10%; after naturally cooling to 35-45 DEG C, cooling water is introduced to cool to room temperature; filtration is carried out while washing with a solution having PH 9 and absolute ethyl alcohol, thus high-melting-point metals, transition metals and impurities such as uranium, thorium, carbon, oxygen and the like are effectively removed; and then in tantalum pyrometallurgy, Si is effectively removed, and the pollution of Fe, Ni and Cr is prevented; and low-melting-point metals of less than 3000 DEG C are further removed in tantalum refining, thereby effectively reducing the contents of C, N and O. By using the preparation method provided by the invention, therefining frequency of an electron beam furnace is saved, and production cost is reduced.

Description

technical field [0001] The invention relates to a preparation method of ultra-high-purity tantalum metal, in particular to a preparation method of target-grade ultra-high-purity tantalum metal. Background technique [0002] Silicon oxide was used as the insulating film between electrodes in semiconductor devices. Large-scale integrated circuits appeared after the 1990s, requiring extremely thin insulating films and larger, more stable and reliable node constants. Therefore, the oxide film of tantalum replaced the silicon oxide film. Oxide film. The oxide film of tantalum is realized by the Ar-O sputtering method, so the tantalum target is required to have high purity, small grain size, good recrystallization texture and three axial consistency. [0003] The production of tantalum targets is completed by two majors: metallurgy and pressure processing. Obtaining high-purity tantalum metal by metallurgy includes three major processes: hydrometallurgy, pyrometallurgy and refin...

Claims

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Application Information

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IPC IPC(8): C22B34/24C22B5/04
Inventor 张宗国郝义田钟岳联张劲唐亮
Owner 稀美资源(广东)有限公司
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