Non-scanning type wavelength dispersion X-ray fluorescence spectrometer

Abstract

The invention provides a non-scanning type wavelength dispersion X-ray fluorescence spectrometer, mainly consisting of an X-ray tube, an aperture, a cylindrical ring light-splitting crystal, a photon counting and imaging detector and an information processor and displayer. The X-ray tube outputs a positive-degree X ray to excite a sample to generate fluorescence X ray; the fluorescence X ray is in incidence to the cylindrical ring light-splitting crystal by the aperture and is subjected to diffraction by the cylindrical ring light-splitting crystal so as to form an annular diffraction fringe image with alternative light and shade; the photon counting and imaging detector reconstructs the annular diffraction fringe image by position sensitive detection and photon counting; and the information processor and displayer analyzes the sample in a qualitative and quantitative manner according to the diameter and luminance of the annular diffraction fringes in the annular diffraction fringe image. The non-scanning type wavelength dispersion X-ray fluorescence spectrometer has a simple structure, is stable in running, strong in robustness, quick in work speed, convenient in upgrading and regulating, and low in power consumption and cost and high in precision, can simultaneously analyze a plurality of substance compositions and can fully utilize each spectral line in an operating wavelength range.

Description

technical field [0001] The invention relates to a brand-new X-ray fluorescence spectrometer, a non-scanning wavelength dispersion X-ray fluorescence spectrometer, and a wavelength dispersion X-ray fluorescence spectrometer based on "small aperture diaphragm + cylindrical ring spectroscopic crystal + photon counting imaging detector". X-ray fluorescence spectrometer. [0002] The invention is mainly used for qualitative and quantitative analysis of elements or other material components, and can be widely used in many industries and disciplines such as environmental monitoring, food safety, bio-optics, material science, metallurgy and chemical industry, geological exploration and metal detection. Background technique [0003] When high-energy particles produced by high-energy X-ray sources, radioactive isotope sources, and protons or synchrotron radiation sources collide with atoms, the atoms will be excited to an unstable excited state, and then the atoms will spontaneously ...

AI Technical Summary

Problems solved by technology

Due to the precision and complexity of the angle measuring device and the displacement mechanism (or rotation mechanism) and the time characteristics of sequential scanning, the anti-interference ability of this type of instrument is often not strong, the operation stability and the convenience of adjustment are poor, and it cannot be analyzed at the same time. Multiple substance components, also work slower

[0007] In addition, because the sequential (or scanning) wavelength dispersive X-ray fluorescence spectrometer needs to be equipped with a set of sophisticated angle measuring device and displacement mechanism (or rotation mechanism), and needs to ensure the precision of its operation, so this type of instrument The structure of the X-ray is complex and bulky, and the X-ray tube, sample, spectroscopic crystal, and detector are all far apart, and the corresponding effective utilization rate of X-rays is low. A high-power X-ray tube is required to maintain the normal operation of the instrument.

As a result, such instruments need to be equipped with expensive high-voltage generators, voltage and flow stabilization devices, and cooling systems for X-ray tubes.

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