Detection method capable of realizing direct acquirement of image of single atom
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- SHANXI UNIV
- Publication Date
- 2012-06-27
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a method for obtaining single atom low-background imaging, in particular to a detection method for directly obtaining single atom imaging. Background technique
[0002] The control and measurement of a single atom has important application prospects in ultra-sensitive monitoring, ultra-low signal analysis, and micro-nano scale manipulation and measurement. , quantum computing and many other aspects are extremely important. As early as 1968, scientists in the former Soviet Union proposed to use lasers to trap atoms at the place with the strongest light intensity. However, due to the shallow trap depth, atoms cannot be directly captured from the background gas at room temperature (see literature V. S. Letokhov, JETP Lett . 7, 272 (1968).); In addition, it was proposed to construct a three-dimensional optical dipole trap scheme combining dipole force and scattering force based on two negatively detuned laser beams facing each oth...