A polishing slurry for polishing titanium-containing substrates
A polishing slurry and base material technology, which is applied in the fields of polishing compositions containing abrasives, electrical components, semiconductor/solid-state devices, etc., can solve problems such as titanium scratches, low titanium removal rate, and failure to achieve polishing effects, etc., to achieve Effect of high removal rate
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Examples
Embodiment 1~20
[0028] Table 1 lists the components of the present invention containing amino acid polishing liquid embodiment 1 ~ 20 and non-amino acid polishing liquid comparative examples 1 ~ 3, according to the formula given in the table, all components are mixed uniformly, and water is used to make up the weight percentage to 100%. with KOH or HNO 3 Adjust to desired pH.
[0029] The blank titanium / titanium nitride was polished by using comparative polishing solutions 1-3 and polishing solutions 1-20 of the present invention. The polishing rates are shown in Table 1.
[0030] Polishing conditions: titanium / titanium nitride wafer, down force 3psi, polishing disc and polishing head speed 70 / 80rpm, polishing pad Politex, polishing liquid flow rate 100ml / min, polishing machine is LogitechPM5Polisher.
[0031]
[0032] The data in the above examples show that the removal rate of titanium / titanium nitride in the examples 1 to 20 of the polishing slurry of the present invention is imp...
Embodiment 21~39
[0034] Table 2 lists the components of Examples 21-39 of the amino acid-containing polishing liquid of the present invention. According to the formula given in the table, all components are mixed evenly, and the weight percentage is made up to 100% with water. with KOH or HNO 3 Adjust to desired pH. The composition formula given in Table 2 can also effectively improve the removal rate of titanium / titanium nitride.
[0035]
Embodiment 40
[0037] The amino acid-containing polishing liquid of the present invention can also add other additives such as methyl cellulose, defoaming agent and the like. like:
[0038] 0.5wt%SiO 2 (average particle size 80nm), 1wt% proline, 0.01wt% methylcellulose, 0.01wt% polysilane defoamer, according to the method described in the above examples, was prepared into a polishing solution.
PUM
| Property | Measurement | Unit |
|---|---|---|
| diameter | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
Login to View More