Preparation method of low-stress gallium nitride epitaxial layer
A gallium nitride and epitaxial layer technology, applied in the field of optoelectronics, can solve the problems of reducing the stress of gallium nitride, unfavorable production process stability and repeatability, etc.
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[0011] Technical scheme of the present invention is as follows:
[0012] A method for preparing a low-stress gallium nitride epitaxial layer, the steps are as follows:
[0013] 1) Etching the front or back of the substrate by dry etching, the etching depth is 1 μm-100 μm, the etching pattern is square or circular, and the size range of its side length or diameter is 0.2mm-5mm, The spacing between the patterns is 1 μm-10 μm.
[0014] 2) Corroding the etched substrate with sulfuric acid or a mixed solution of sulfuric acid / phosphoric acid, the etching time is 1 min-30 min at normal temperature, or 1 min-10 min at 50-200° C. The purpose of this step is to remove the etch marks and impurities produced by the etching described in step 1).
[0015] 3) Wash the substrate treated in step 2) with deionized water, and spin dry. Drying or air drying can also be used here, but in order to avoid water marks, spin drying is preferred.
[0016] 4) On the front side of the substrate treat...
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