Polarization laser wavelength meter

Abstract

The invention discloses a polarization laser wavelength meter. The traditional wavelength meter has the problems of complex structure or higher cost and the like. The polarization laser wavelength meter is characterized in that a reference laser and a measured laser are respectively emitted into a laser polarization interferometer lens set through a first mechanical shutter and a second mechanical shutter and respectively form respective laser polarization interferometers, and the laser polarization interferometers measure the displacement of a moving mirror fixed on a piezoelectric ceramic and output linear polarization laser beams; the linear polarization laser beams are emitted to a polarimeter; two signals inside the polarimeter pass through a filter shaping circuit to become equal-frequency TTL (Transistor-Transistor Logic) signals, and the two equal-frequency TTL signals are transmitted to a phase meter for phase measurement; and the phase meter is connected with a PC (Personal Computer) machine through a GPIB (General Purpose Interface Bus) line. The polarization laser wavelength meter disclosed by the invention effectively reduces the influence of environmental mechanical vibration on a measurement result, can be used for places with more complex work environments and has the advantages of simple structure and small size; and the used laser polarization interferometers have the advantages of easy optical path arrangement and easy optical regulation and optical path alignment operation.

Description

technical field [0001] The invention relates to a wavelength meter, in particular to a polarized laser wavelength meter. Background technique [0002] The laser wavelength / frequency measurement instrument, namely the wavelength meter, can be used to measure the output wavelength value of a tuned laser, or to measure the wavelength value of an unknown laser, and plays an important role in the field of optical frequency standard research. [0003] Among the existing laser wavelength measurement systems, the Michelson interferometer type wavelength meter occupies the mainstream. Although this type of wavelength meter has the characteristics of high precision, it has high requirements for the stroke of the moving parts. For 633nm wavelength, the stroke of moving parts should be about 15 mm, so the measurement system is easily affected by mechanical vibration, so it is not suitable for use in workplaces with complex environments. [0004] The Fischer laser interferometer wavele...

AI Technical Summary

Problems solved by technology

[0005] Chinese Invention Patent Publication No. CN102155997A discloses a fiber-optic laser wavelength meter that utilizes the photocouple effect of Fe transparent hollow cathode lamps to calibrate the wavelength to an accuracy of 0.01pm. The wavelength measurement device uses a grating monochromator and a high-sensitivity CCD light receiver device, wavelength calibration device and wavelength precision measurement device, etc., the structure is relatively complex and the cost is high

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