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Non-ionic ammonium hydrogen fluoride etching solution with low surface tension

A low surface tension, acidic ammonium fluoride technology, applied in the direction of surface etching compositions, chemical instruments and methods, etc., can solve the problems of weak permeability, high production cost, inability to adjust the surface tension of etching solution, etc., and achieve low surface tension Tension, increased permeability effect

Active Publication Date: 2014-03-26
JIANGYIN RUNMA ELECTRONICS MATERIAL
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The composition of the above etching solution is complex. Compared with the main components of hydrofluoric acid and ammonium fluoride, the amount of surfactant activity is relatively large, and the production cost is high; in addition, when the concentration of hydrogen fluoride and ammonium fluoride in the etching solution is high, generally non- Ionic surfactants are difficult to dissolve, cannot adjust the surface tension of the etching solution, and have relatively weak permeability, making it difficult to etch into very small pores

Method used

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  • Non-ionic ammonium hydrogen fluoride etching solution with low surface tension

Examples

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Embodiment 7

[0023] In Example 7, the additives are octylamine and polyglyceryl perfluorohexylsulfonate, the mass of octylamine in the additive accounts for 30% of the total amount of the additive, and the minimum etching pore size is 5 μm;

Embodiment 8

[0024] In Example 8, the additives are octylamine and polyglyceryl perfluorohexyl sulfonate, the mass of octylamine in the additive accounts for 40% of the total amount of the additive, and the minimum etching pore size is 5 μm;

Embodiment 9

[0025] In Example 9, the additives are octylamine and polyglyceryl perfluorohexyl sulfonate, the mass of octylamine in the additive accounts for 35% of the total amount of the additive, and the minimum etching pore size is 5 μm;

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Abstract

The invention discloses a non-ionic ammonium hydrogen fluoride etching solution with low surface tension. The non-ionic ammonium hydrogen fluoride etching solution consists of hydrogen fluoride, ammonium fluoride, an additive and deionized water, wherein preferably, the additive is selected from one or more of polyethylene glycol monoperfluorononylene ether, perfluorohexane sulfonic acid polyglycerol ester, octylamine, polyglycerol perfluorononylene ether, polyethylene glycol perfluorononylene methyl ether, and perfluorohexane sulfonic acid macrogol ester. A proper additive is added on the basis of the hydrogen fluoride etching solution in the prior art and can be dissolved into high-concentration hydrogen fluoride and ammonium fluoride without introducing any metal ion or negative ion, so that residues on the surface of an etched oxide layer are eliminated, low surface tension is achieved for the etching solution, the permeability of the etching solution is increased, and the etching solution can enter a pore of which the pore diameter is 2.5 mu m; the fluorocarbon chain of a fluorine surfactant in a surfactant composition has the properties of high surface activity, hydrophobicity and lipophobicity, so that the surface tension of the solution can be reduced greatly, the using amount of the etching solution is small, and the production cost is low.

Description

technical field [0001] The invention relates to the technical field of electronic chemicals in semiconductor and liquid crystal display thin film transistor (TFT) industries, in particular to a non-ionic low surface tension acidic ammonium fluoride etchant used in semiconductor processes and liquid crystal processes. Background technique [0002] A large number of thin films and thin layers are provided on the TFT substrate, so in order to prevent undesired electrical short circuits between them, it is preferable to uniformly incline the cut side of the etched substrate, that is, the etching profile, and make the lower part wider than the upper part, For blunt cone (taper) shape. This is because the difference in height between two or more thin film layers formed when the etching profile is blunt tapered is reduced. Etching methods include dry etching using gas and wet etching using etching liquid. Although wet etching has disadvantages, the equipment investment cost requir...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C09K13/08
Inventor 戈士勇
Owner JIANGYIN RUNMA ELECTRONICS MATERIAL
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