LED (light emitting diode) structure and manufacturing method thereof
A technology of LED structure and manufacturing method, which is applied in the direction of electrical components, circuits, semiconductor devices, etc., can solve the problems of consuming large metal organic compound sources, increasing device costs, and rising chip costs, so as to save metal organic compound sources and reduce growth. Time, application of a wide range of effects
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no. 1 example
[0056] refer to figure 2 A substrate 11 is provided. As a non-limiting example, the substrate 11 in this embodiment is a silicon substrate, for example, a 2-8 inch silicon substrate.
[0057] After that, the reflective layer 12 is formed on the surface of the substrate 11 . The reflective layer 12 is preferably a Bragg reflector structure, for example, silicon oxide (SiO2) can be formed by evaporation or sputtering. 2 ) and titanium oxide (TiO 2 ) periodic structure, that is, the Bragg mirror structure. Preferably, ion-assisted evaporation can be used to deposit SiO 2 and TiO 2 cycle structure. By adjusting the film thickness, the reflection rate of the formed reflective layer 12 between 440-550 nm wavelength can be higher than 95%, and its thickness range is preferably 0.1-100 μm, more preferably 2-3 μm.
[0058] For example, in this embodiment, the period of the Bragg reflector is 28 periods, and its thickness is about 2.13um.
[0059] refer to image 3 , forming an...
no. 2 example
[0070] refer to figure 2 , a substrate 11 is provided, and the substrate 11 in this embodiment is a sapphire substrate. A reflective layer 12 is then formed on the substrate 11 . Please refer to the first embodiment for the material, structure, and formation process of the reflective layer 12 , which will not be repeated here.
[0071] refer to image 3 , forming an AlN buffer layer 13 on the reflective layer 12 . In the second embodiment, the method of forming AlN is still the radio frequency magnetron sputtering method, but the AlN target is not used to react to form AlN, but the AlN target is directly sputtered to obtain the AlN buffer layer 13 with a preferred orientation. The specific process conditions are: the working pressure is 2.0Pa, the power is 300W, the temperature is 370°C, and the sputtering atmosphere is N 2 The concentration of 99.99%.
[0072] refer to Figure 4 , the LED light emitting structure 17 is deposited on the AlN buffer layer 13 by MOCVD meth...
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