N type PERC crystalline silicon solar cell and preparation method thereof
A technology of solar cells and crystalline silicon, applied in circuits, photovoltaic power generation, electrical components, etc., can solve problems such as scarcity of technical solutions, and achieve the effects of improving technical assurance, convenient operation, and improving absorption
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Embodiment 1
[0043] In this embodiment, a 156mm N-type single crystal silicon wafer is used as the base material to remove damage, texture, and clean the N-type silicon wafer; a P-type emitter junction is formed by using tubular boron diffusion, and the diffusion resistance is controlled at 80 ohm / sq. The naturally formed borosilicate glass is used as the front mask of the battery to achieve the purpose of removing the reflective junction and polishing on the back of the silicon wafer. At the same time, use 5% hydrofluoric acid solution to remove the borosilicate glass on the textured surface of the silicon wafer Wash with 1% hydrofluoric acid solution. An aluminum oxide passivation film with a thickness of 10nm was grown on the front of the silicon wafer, and a silicon nitride film with a thickness of 120nm was grown on the back of the silicon wafer by PECVD. 68nm silicon nitride anti-reflection film, after the growth of the dielectric film, print silver-aluminum paste grid lines on the f...
Embodiment 2
[0047] In this embodiment, a 156mm N-type single crystal silicon wafer is used as the base material to remove damage, texture, and clean the N-type silicon wafer; a P-type emitter junction is formed by using tubular boron diffusion, and the diffusion resistance is controlled at 45 ohm / sq. The naturally formed borosilicate glass is used as the front mask of the battery to achieve the purpose of removing the reflective junction and polishing on the back of the silicon wafer. At the same time, use 5% hydrofluoric acid solution to remove the borosilicate glass on the textured surface of the silicon wafer Wash with 1% hydrofluoric acid solution. An aluminum oxide passivation film with a thickness of 2nm is grown on the front of the silicon wafer, and a silicon nitride film with a thickness of 200nm is grown on the back of the silicon wafer by PECVD. 90nm silicon nitride anti-reflection film, after the growth of the dielectric film, print silver-aluminum paste grid lines on the fron...
Embodiment 3
[0051] In this embodiment, a 156mm N-type single crystal silicon wafer is used as the base material to remove damage, texture, and clean the N-type silicon wafer; a P-type emitter junction is formed by using tubular boron diffusion, and the diffusion resistance is controlled at 140 ohm / sq. The naturally formed borosilicate glass is used as the front mask of the battery to achieve the purpose of removing the reflective junction and polishing on the back of the silicon wafer. At the same time, use 5% hydrofluoric acid solution to remove the borosilicate glass on the textured surface of the silicon wafer Wash with 1% hydrofluoric acid solution. An aluminum oxide passivation film with a thickness of 40nm was grown on the front of the silicon wafer, and a silicon nitride film with a thickness of 50nm was grown on the back of the silicon wafer by PECVD. 50nm silicon nitride anti-reflection film, after the growth of the dielectric film, print silver-aluminum paste grid lines on the f...
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Abstract
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