Unlock instant, AI-driven research and patent intelligence for your innovation.

A microwave frequency measurement chip and its application method and manufacturing method

A microwave frequency measurement and chip technology, applied in the direction of frequency measurement devices, etc., can solve the problems of limited frequency measurement range, high price, limit measurement error, etc., and achieve the effect of power consumption advantage

Active Publication Date: 2017-05-31
UNITED MICROELECTRONICS CENT CO LTD
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The currently reported schemes for microwave frequency measurement by photonic means mainly include the following three schemes: one is to construct a function of unknown frequency and time, and the microwave signal modulates the optical carrier, and the two sidebands are measured after passing through a dispersive medium. The magnitude of the delay difference generated to determine the unknown frequency, but this method is limited by the instrument and the measurement error is large; the second is to construct a function of the unknown microwave frequency and space, under small signal modulation, the optical sideband and the optical carrier The interval in the frequency domain is converted into a spatial distribution, so as to detect the microwave frequency of the signal to be tested, generally using a chirped Bragg grating, a free space diffraction grating, a combination of prisms, etc.
The third is to construct the function of unknown microwave frequency and optical power intensity, filter the optical sidebands through optical comb filters or fiber gratings, and convert microwave frequency information into light intensity changes, which is also one of the main research directions at present. , the advantage of this scheme is that the low-speed photodetector can meet the needs, but there are also some problems such as limited frequency measurement range
In the current reports, the above three solutions are mostly based on discrete optical components, which are expensive and the test system is bulky and less stable.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A microwave frequency measurement chip and its application method and manufacturing method
  • A microwave frequency measurement chip and its application method and manufacturing method
  • A microwave frequency measurement chip and its application method and manufacturing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] In order to make the objectives, technical solutions and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with implementation examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0020] see figure 1 , the microwave frequency measurement chip of the present invention is based on silicon-based optoelectronic technology, including a grating coupler 5 , a phase modulator 8 , a filter based on a microring cavity 7 , and a bus waveguide 9 . The bus waveguide 9 is used for signal transmission between the grating coupler 5 , the phase modulator 8 and the filter.

[0021] The grating coupler 5 is used to receive an optical signal and output an optical carrier signal. The optical carrier signal is transmitted in the bus waveguide 9 and first passes through the phase modulator 8 . The unknow...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a microwave frequency measurement chip as well as an applying method and a preparing method thereof. The microwave frequency measurement chip comprises an optical grating coupler, a phase modulator, a filter based on a micro-ring resonant cavity and a bus waveguide. An optical signal is coupled by a coupling optical grating and enters the chip, an optical carrier signal is transmitted in the bus waveguide and first passes the phase modulator, the optical carrier signal is modulated by an unknown microwave signal to be measured through an intensity modulator, the modulated signal enters the micro-ring resonant cavity through the bus waveguide, two paths of optical power are respectively output at the upper and lower speech path ends of the filter, and the unknown microwave signal can be determined through calculating the specific value of the measured optical power. The microwave frequency measurement chip realizing the detection of the unknown microwave signal by a silicon-based photonic integrated chip has the advantages of small chip size, light weight, high integration, low cost and electromagnetic interference resistance. Meanwhile, the invention further discloses an applying method and a preparing method of the chip.

Description

technical field [0001] The invention relates to the field of planar optical waveguide integration, in particular to a microwave frequency measurement chip based on silicon-based optoelectronic technology and its application method and manufacturing method. Background technique [0002] In electronic information warfare, it is of great significance to quickly determine the frequency of intercepted radio frequency signals, which can be used for interception and eavesdropping of radar signals and communication signals, electronic countermeasures and anti-countermeasures, etc. With the development of millimeter wave technology and optoelectronic technology, the operating frequency of modern electronic information warfare equipment has been continuously developed to a wider frequency band, and the content of electronic information warfare has also developed from communication confrontation in World War I to World War II Radio frequency countermeasures such as radar countermeasure...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R23/02
Inventor 王皖君郭进冯俊波周杰崔乃迪
Owner UNITED MICROELECTRONICS CENT CO LTD