A kind of polishing agent and polishing liquid with self-cleaning effect
A self-cleaning, polishing agent technology, applied in polishing compositions containing abrasives, polishing compositions, chemical instruments and methods, etc., can solve problems such as epitaxial film corrosion, increase surface activity, avoid adhesion, simplify The effect of the cleaning process
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Embodiment 1
[0025] The polishing agent with self-cleaning effect of the present embodiment includes the following components in parts by weight: 20 parts of colloidal silicon dioxide with a particle size of 10 to 30 nm, 0.6 part of potassium hydroxide, 0.08 part of coconut acid diethanolamine condensate, surface Active agent 0.06 part. Wherein, the surfactant is a mixture of sodium lauryl sulfate and nonylphenol polyoxyethylene ether in a mass ratio of 1:1.
[0026] The polishing liquid with self-cleaning effect of the present embodiment contains the following components in mass percentage: 20% of colloidal silicon dioxide, 0.6% of potassium hydroxide, 0.08% of coconut acid diethanolamine condensate, surface active Agent 0.06%, the balance is water. Wherein, the surfactant is a mixture of sodium lauryl sulfate and nonylphenol polyoxyethylene ether in a mass ratio of 1:1.
[0027] The preparation method is as follows: take 1000 g of colloidal silicon dioxide, 30 g of potassium hydroxide,...
Embodiment 2
[0029] The polishing agent with self-cleaning effect of the present embodiment includes the following components in parts by weight: 40 parts of fumed silica with a particle size of 30 to 50 nm, 5 parts of tetramethylammonium hydroxide, and condensate of coconut acid diethanolamine 1 part, 0.5 part of surfactant. Wherein, the surfactant is a mixture of sodium lauryl sulfate and nonylphenol polyoxyethylene ether in a mass ratio of 3:1.
[0030] The polishing liquid with self-cleaning effect of the present embodiment contains the following components in mass percentage: particle size is 40% of fumed silicon dioxide of 30-50nm, 5% of tetramethylammonium hydroxide, 1% of coconut acid diethanolamine condensate , Surfactant 0.5%, balance is water. Wherein, the surfactant is a mixture of sodium lauryl sulfate and nonylphenol polyoxyethylene ether in a mass ratio of 3:1.
[0031] The preparation method is as follows: mix the fumed silicon dioxide, tetramethylammonium hydroxide, coco...
Embodiment 3
[0033] The polishing agent with self-cleaning effect of this embodiment includes the following components in parts by weight: 5 parts of precipitated silica with a particle size of 50-100 nm, 1 part of sodium hydroxide, 0.1 part of coconut acid diethanolamine condensate, Surfactant 0.01 part. Wherein, the surfactant is a mixture of sodium lauryl sulfate and nonylphenol polyoxyethylene ether in a mass ratio of 1:2.
[0034] The polishing liquid with self-cleaning effect of the present embodiment contains the following components in mass percentage: 5% of precipitated silicon dioxide, 1% of sodium hydroxide, 0.1% of coconut acid diethanolamine condensate, surface The active agent is 0.01%, and the balance is water. Wherein, the surfactant is a mixture of sodium lauryl sulfate and nonylphenol polyoxyethylene ether in a mass ratio of 1:2.
[0035]The preparation method is as follows: the polishing agent is obtained after mixing the precipitated silica, sodium hydroxide, coconut ...
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Abstract
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