Multistage magnetic field ion plating and twin-target high-power pulse magnetron sputtering composite method

A magnetron sputtering composite, high-power pulse technology, applied in the field of material surface treatment, can solve the problems of low arc plasma transmission efficiency, low ionization rate and film deposition efficiency, unstable ignition, etc., to eliminate large particles Defects, improvement of crystal structure and stress state, effect of energy increase

Pending Publication Date: 2016-08-31
魏永强
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to solve the problem that the traditional arc ion plating method is easy to produce large particle defects, and the magnetic filter technology causes low arc plasma transmission efficiency, and break through the pure metal with low melting point (such as aluminum) or multi-component alloy materials (such as aluminum-silicon alloy), non-metallic materials (such as graphite) and semiconductor materials (such as silicon) as the limitations of the traditional arc ion plating method, the traditional magnetron sputtering technology Low melting rate and film deposition efficiency, limitations of high melting point target materials, high power pulse magnetron sputtering discharge and ignition instability, low melting point pure metals (such as aluminum) or multi-element alloy materials and non-metallic materials (such as Graphite and semiconductor material silicon, etc.) are used as the target material of twin target high-power pulse magnetron sputtering, and then the arc ion plating method is used to ionize the high-melting point target material to produce continuous and stable plasma with high ionization rate. The straight tube magnetic filtration method eliminates the large particle defects contained in the arc plasma, and at the same time ensures that the arc plasma passes through the filter device with a high transmission efficiency, so that the surface of the workpiece can be continuously and densely prepared with high-quality films under the condition of applying a negative bias voltage. At the same time, it can control the addition of elements in the film, reduce the production cost of using alloy targets, improve the deposition efficiency of the film, reduce the adverse effects of discharge instability and large particle defects on the growth and performance of the film, and propose a multi-level magnetic field ion plating and Combination method of twin target high power pulsed magnetron sputtering

Method used

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  • Multistage magnetic field ion plating and twin-target high-power pulse magnetron sputtering composite method

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specific Embodiment approach 1

[0016] Specific implementation mode one: the following combination picture 1 Describe this embodiment, this embodiment Combination method of multi-level magnetic field ion plating and twin target high-power pulsed magnetron sputtering The devices used include bias power supply 1, arc power supply 2, arc ion plating target source 3, multi-level magnetic field device 4, twin target high-power pulse magnetron sputtering power supply 6, twin target high-power pulse magnetron sputtering target source 7 , Twin target high-power pulse magnetron sputtering power supply waveform oscilloscope 8, bias power supply waveform oscilloscope 9, vacuum chamber 10 and sample stage 11;

[0017] The method includes the following steps:

[0018] Step 1, place the substrate workpiece to be processed on the sample stage 11 in the vacuum chamber 10, connect the workpiece to the output end of the bias power supply 1, and connect the arc ion plating target source 3 installed on the vacuum chamber 10 ...

specific Embodiment approach 2

[0027] Embodiment 2: The difference between this embodiment and Embodiment 1 is that the method also includes:

[0028] Step 3. Traditional DC magnetron sputtering, pulse magnetron sputtering, twin target intermediate frequency magnetron sputtering, twin target high power pulse magnetron sputtering, traditional arc ion plating, pulse cathode arc or multi-stage magnetic field arc can be used alone Ion plating combined with DC bias, pulse bias or DC pulse composite bias for film deposition to prepare pure metal films, compound ceramic films with different element ratios, functional films and high-quality films with nano-multilayer or gradient structures;

[0029] In step 2, the twin target high-power pulse magnetron sputtering power supply 6 can be used to perform magnetron sputtering combined with a high-voltage pulse bias power supply to perform the pinning effect of high-energy ions on the growth of the film to improve the bonding force between the film and the substrate, and ...

specific Embodiment approach 3

[0030] Embodiment 3: The difference between this embodiment and Embodiment 2 is that steps 1 to 3 are repeated to prepare multi-layered films with different stress states, microstructures and element ratios, and the others are the same as Embodiment 2;

[0031] In step 2, the twin target high-power pulse magnetron sputtering power supply 6 can be used first to perform magnetron sputtering combined with high voltage to perform the pinning effect of high-energy ions on the growth of the film to improve the bonding force between the film and the substrate, and then proceed to step 3, and then Step 2 and Step 3 are repeated, and so on, to prepare multilayer structure films with different stress states, microstructures and element ratios.

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Abstract

The invention discloses a multistage magnetic field ion plating and twin-target high-power pulse magnetron sputtering composite method and belongs to the technical field of material surface treatment. The problems that low-melting-point pure metal (such as aluminum) or multi-component alloy materials (such as aluminum and silicon) and non-metallic materials (such as graphite and semiconducting material silicon) have the micro-particle defect in a traditional arc ion plating method, a common magnetron sputtering technology is low in ionization rate and thin film deposition efficiency, the melting point is high, a target material difficult to ionize has using limitations, and high-power pulse magnetron sputtering discharge is unstable in ignition are solved. The multistage magnetic field ion plating and twin-target high-power pulse magnetron sputtering composite method comprises the steps that 1, a workpiece is placed on a sample stage inside a vacuum chamber and connected with related equipment; and 2, thin film deposition is conducted, specifically, vacuumizing is conducted till the pressure reaches 10-4 Pa, then, working gas is injected, a film plating power source is turned on, the energy of composite plasma is adjusted through a bias power source, the micro-particle defect is eliminated through a multistage magnetic field filtering device, the transmission efficiency of the arc plasma is ensured, and the arc plasma and twin targets are combined to produce high-ionization-rate multi-component plasma, and a thin film is prepared.

Description

technical field [0001] The invention relates to a composite method of multi-level magnetic field ion plating and twin target high-power pulse magnetron sputtering, and belongs to the technical field of material surface treatment. Background technique [0002] Arc ion plating technology can obtain almost all metal ions including carbon ions. At the same time, it has the advantages of high ionization rate, good diffraction, good film-substrate bonding force, good coating quality, high deposition efficiency and easy operation of equipment. Attention is paid to it, and it is one of the physical vapor deposition preparation technologies widely used in industry at present. It can not only be used to prepare metal protective coatings, but also realize the preparation of high-temperature ceramic coatings such as nitrides and carbides through the adjustment of process methods, and it is also used in the field of functional thin films. Arc ion plating can achieve rapid deposition of ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23C14/32C23C14/35
CPCC23C14/325C23C14/352
Inventor 魏永强宗晓亚魏永辉吴忠振侯军兴蒋志强符寒光
Owner 魏永强
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