A kind of growth method of Gan-based light-emitting diode epitaxial wafer
A light-emitting diode and growth method technology, which is applied in the growth field of GaN-based light-emitting diode epitaxial wafers, can solve the problems of high warpage and fragmentation rate, and achieve the effects of improving warpage, improving crystal quality, and improving lattice mismatch
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Embodiment 1
[0048] An embodiment of the present invention provides a method for growing a GaN-based light-emitting diode epitaxial wafer, see figure 1 , the growth method includes:
[0049] Step 101: heat-treating the substrate in a pure hydrogen atmosphere by raising the temperature.
[0050] Optionally, this step 101 may include:
[0051] The temperature is raised in multiple stages, and then the substrate is heat-treated in a pure hydrogen atmosphere.
[0052] In this embodiment, the temperature in the same stage is constant, and the temperature in different stages increases with time.
[0053] Optionally, the rate of increase of temperature in different stages can be kept constant (such as Figure 2a shown), gradually decreasing (such as Figure 2b shown) or gradually increased (as Figure 2c shown).
[0054] Optionally, the temperature difference between two adjacent stages can be set according to the requirements of epitaxial growth, so as to select an optimal value matching t...
Embodiment 2
[0095] An embodiment of the present invention provides a method for growing a GaN-based light-emitting diode epitaxial wafer, and the growth method provided in this embodiment is a specific realization of the growth method provided in Embodiment 1. In an embodiment, with high-purity hydrogen (H 2 ) or nitrogen (N 2 ) as carrier gas, trimethylgallium (TMGa), trimethylaluminum (TMAl), trimethylindium (TMIn) and ammonia (NH 3 ) respectively as sources of Ga, Al, In, and N, using silane (SiH 4 ), Magnesium (Cp 2 Mg) as N-type and P-type dopants respectively. see image 3 , the growth method includes:
[0096] Step 201: The temperature of the substrate is first raised to 500°C, then raised to 800°C and stabilized for 30s, then raised to 1000°C and stabilized for 30s, then raised to 1230°C and stabilized for 10 minutes, and then heat-treated in a pure hydrogen atmosphere.
[0097] Step 202: Lower the temperature to 540° C., and deposit a GaN layer with a thickness of 30 nm to ...
Embodiment 3
[0110] An embodiment of the present invention provides a method for preparing a light-emitting diode epitaxial wafer. The difference between the preparation method provided in this embodiment and the method provided in Embodiment 2 is that the Al composition of the first AlGaN layer in the transition layer is 20%, the Al composition of the second AlGaN layer starts from 40%, and the first layer is reduced by 5% (such as Figure 5 shown).
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