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Ultrathin silicon chemical cutting method

A chemical cutting and ultra-thin technology, applied in the field of material processing, can solve the problems of silicon material loss, difficult ultra-thin silicon wafer cutting, silicon wafer damage layer, etc.

Active Publication Date: 2017-08-11
KUNMING UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Currently commonly used silicon material cutting technology mainly includes mortar cutting technology and diamond wire cutting technology. Compared with traditional mortar cutting technology, diamond wire saw cutting technology has cost advantages in terms of energy consumption, silicon consumption and emission, and this technology can also Maximizing the technical advantages of high cutting speed, thin wire, and thin slices is of great significance to further reduce the cost of silicon-based solar cell preparation. However, both mortar cutting and diamond wire cutting are physical cutting methods, and there are the following Problems: (1) The cutting process requires external equipment to provide cutting power. (2) The cutting process will consume the wire saw. (3) The process of cutting silicon ingots not only consumes silicon material but also forms a damaged layer on the surface of the silicon wafer. (4 ) Difficult to cut ultra-thin silicon wafers

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0022] The monocrystalline silicon ingot was ultrasonically cleaned with ethanol and deionized water for 10 minutes in sequence; the Au wire was soaked in a nitric acid solution with a mass percentage concentration of 0.01% for 30 minutes; HF / H 2 o 2 The mixed solution is used as the etching solution, the mass percent concentration of hydrofluoric acid in the etching solution is 20%, and the mass percent concentration of the oxidant is 30%; the Au wire after soaking is suspended and fixed in the etching tank, and the cleaned The silicon ingot is placed above the Au wire, the prepared etching solution is poured into the etching tank, and the silicon ingot and the metal wire are completely submerged. After the cutting is completed, the silicon sheet is placed in a KOH solution with a mass percentage concentration of 1%. Soak it in water for 20 minutes, and finally rinse with a large amount of deionized water and dry it.

Embodiment 2

[0024] The monocrystalline silicon ingot was ultrasonically cleaned with ethanol and deionized water for 10 minutes in sequence; the Ag silk thread was soaked in a 2% nitric acid solution by mass percentage for 30 seconds; HF / Na 2 S 2 o 8 The mixed solution is used as etching solution, and the mass percent concentration of hydrofluoric acid in the etching solution is 10%, and the mass percent concentration of oxidizing agent is 80%; After soaking, the Ag silk thread is suspended and fixed in the etching tank, and the cleaned The silicon ingot is placed above the Ag wire, the prepared etching solution is poured into the etching tank, and the silicon ingot and the metal wire are completely submerged. After the cutting is completed, the silicon sheet is placed in a KOH solution with a mass percentage concentration of 30%. Soak for 5 minutes; finally rinse with plenty of deionized water and blow dry.

Embodiment 3

[0026] The polysilicon ingot was ultrasonically cleaned with ethanol and deionized water for 10 minutes in sequence; the Pt wire was soaked in 5% nitric acid solution for 10 seconds; HF / K 2 Cr 2 o 7 The mixed solution of mixed solution is used as etching liquid, and the mass percentage concentration of hydrofluoric acid is 50% in etching liquid, and the mass percentage concentration of oxidant is 50%; After soaking, the Pt wire is suspended and fixed in the etching tank, and the cleaned The silicon ingot is placed above the Pt wire, the prepared etching solution is poured into the etching tank, and the silicon ingot and the metal wire are completely submerged. After the cutting is completed, the silicon sheet is placed in a KOH solution with a mass percentage concentration of 30%. Soak for 5 minutes; finally rinse with plenty of deionized water and blow dry.

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Abstract

The invention discloses an ultrathin silicon chemical cutting method and belongs to the material processing technology field. According to the method, through the catalysis effect of metal Au, Pt, Ag and Pd wires, a primary cell reaction formed between the metal wires and silicon ingot is generated, under the chemical etching liquid action, continuous dissolution of a silicon material below the metal wires is realized, and chemical cutting of the silicon material is realized. Compared with traditional physical cutting, e.g., mortar cutting and diamond wire cutting, no external large-scale power equipment is needed, the precious metal wires are utilized to realize the catalysis effect on the primary cell reaction, and no damage is generated in a cutting process; the wires are quite fine, and ultrathin silicon cutting capability smaller than 30mum can be realized.

Description

technical field [0001] The invention belongs to the technical field of material processing, and in particular relates to a chemical cutting method for ultra-thin silicon. Background technique [0002] Solar cells are the core components of photovoltaic power generation. With its high storage capacity of nearly 28% in the earth, suitable energy band structure, clean and non-polluting, relatively mature preparation technology and excellent performance stability, silicon has become the The main material of commercial solar cells (~93%), in the production process of silicon-based solar cells, the cost of raw silicon and slices accounts for about 40%. The development of silicon wafers in the direction of thinner slices and larger diameters, and the development of new slicing technologies are undoubtedly of great significance to reduce the cost of photovoltaic power generation and promote the large-scale application of photovoltaics. [0003] Currently commonly used silicon mater...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/02B28D5/04
CPCH01L21/0201B28D5/045
Inventor 李绍元马文会于洁万小涵杨春曦杨佳魏奎先雷云吕国强谢克强伍继君杨斌戴永年
Owner KUNMING UNIV OF SCI & TECH