A dielectric filled metal grating-semiconductor SPP source and manufacturing method thereof
A metal grating, medium filling technology, applied in the direction of waveguide, waveguide type device, circuit, etc., to achieve the effect of high process compatibility, high coupling efficiency and simple process
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Embodiment 1
[0043] A method for manufacturing the SPP source of a dielectric-filled metal grating-semiconductor composite structure, comprising the following process steps:
[0044] Step 1: GaAs-based epitaxial material is grown on N-type GaAs substrate 11 by metal organic chemical vapor deposition (MOCVD) or molecular beam epitaxy (MBE). The epitaxial material includes N-type AlGaAs 12 , quantum well 13 , and P-type AlGaAs capping layer 14 . as attached figure 1 shown. The central wavelength of quantum well electroluminescence is 850nm.
[0045] Step 2: Evaporate a Ti / Au metal layer 21 on the back of the GaAs substrate 11 to form an ohmic contact with the N-type GaAs substrate. as attached figure 2 shown.
[0046] Step 3: Evaporate Au 31 on the surface of the P-type AlGaAs capping layer with a thickness of 200nm. as attached image 3 shown.
[0047]Step 4: using focused ion beam etching to form an inclined Au grating structure on the Au surface of the P-type AlGaAs capping layer...
Embodiment 2
[0053] A method for manufacturing the SPP source of a dielectric-filled metal grating-semiconductor composite structure, comprising the following process steps:
[0054] Step 1: GaN-based epitaxial material is grown on the sapphire substrate 71 by metal organic chemical vapor deposition (MOCVD) or molecular beam epitaxy (MBE). The epitaxial material includes N-type GaN 72 , quantum well 73 , and P-type GaN capping layer 74 . The central wavelength of quantum well electroluminescence is 550nm.
[0055] Step 2: Etching device units on the semiconductor epitaxial layer to expose the N-type GaN 72 .
[0056] Step 3: Evaporate Cr / Au 75 on the surface of the etched N-type GaN to form an ohmic contact with the N-type GaN.
[0057] Step 4: Ag 150nm is evaporated on the surface of the P-type GaN capping layer.
[0058] Step 5: using focused ion beam etching to form an inclined Ag grating structure on the Ag surface of the P-type GaN capping layer to obtain an Ag layer 76 with a grat...
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