Second harmonic microscopic imaging system based on Bessel beam pulse shaping

A Bessel beam, second harmonic technology, applied in the field of second harmonic microscopic imaging system, can solve problems such as affecting imaging resolution, achieve high resolution, and suppress the effect of light diffraction

Active Publication Date: 2018-03-06
INST OF CHEM CHINESE ACAD OF SCI
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Problems solved by technology

However, the second-harmonic microscopes built in the past have not been able to shape the energy of the incident pulse laser well. The energy distribution of the laser used is generally Gaussian distribution...

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  • Second harmonic microscopic imaging system based on Bessel beam pulse shaping
  • Second harmonic microscopic imaging system based on Bessel beam pulse shaping
  • Second harmonic microscopic imaging system based on Bessel beam pulse shaping

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Embodiment Construction

[0021] The present invention will be described in detail below in conjunction with the accompanying drawings. However, it should be understood that the accompanying drawings are provided only for better understanding of the present invention, and they should not be construed as limiting the present invention. In the description of the present invention, it should be understood that the terms "first", "second" and so on are only used for the purpose of description, and should not be understood as indicating or implying relative importance.

[0022] Such as figure 1As shown, the second harmonic microscopic imaging system based on Bessel beam pulse shaping provided by the present invention includes a femtosecond pulse laser 1, a half-wave plate 2, a Glan prism 3, a mirror 4, and a spatial optical isolator 5 , mirror 6, first adjustable diaphragm 7, axicon lens 8, second adjustable diaphragm 9, first achromatic lens 10, second achromatic lens 11, third achromatic lens 12, third a...

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Abstract

The invention relates to a second harmonic microscopic imaging system based on Bessel beam pulse shaping. A femtosecond pulse laser transmits femtosecond pulse lasers with energy in Gaussian distribution to a space light isolator by virtue of a half wave plate and a Glan prism sequentially, lights emergent from the space light isolator are transmitted to a first adjustable diaphragm, lights emergent from the first adjustable diaphragm are transmitted to a cone lens to be converted into Bessel lights, the Bessel lights emergent from the cone lens are transmitted to a second adjustable diaphragm, lights emergent from the second adjustable diaphragm are transmitted to a third adjustable diaphragm by virtue of a achromatic lens assembly, lights emergent from the third adjustable diaphragm arescanned and transmitted to a telecentric conjugated system by virtue of a scanning galvanometer assembly, lights emergent from the telecentric conjugated system are transmitted to another half wave plate, light emergent from another half wave plate are transmitted to a dichroscope by virtue of the telecentric conjugated system, lights emergent from the dichroscope are focused on a sample on an objective table by virtue of a microscope objective, the sample produces a second harmonic signal, and then the second harmonic signal is collected by virtue of the microscope objective and then is acquired by an EMCCD by virtue of the dichroscope and a light filter.

Description

technical field [0001] The invention relates to a second harmonic microscopic imaging system, in particular to a second harmonic microscopic imaging system based on Bessel beam pulse shaping, and relates to the technical field of microscopic imaging. Background technique [0002] Optical microscopes have the advantages of intuition and convenient sample handling when observing objects, and optical resolution is an important criterion to measure whether an optical microscope system is excellent. With the development of laser technology, the microscopic imaging system using laser as light source has been greatly developed, and its resolution has been greatly improved. At present, technologies based on the principle of fluorescence imaging have made great progress, such as Structured Illumination Microscopy (SIM), Stimulated Emission Depletion Microscopy (STED) and single-molecule localization and Single Molecule Localization and Composition (Single Molecule Localization and C...

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Application Information

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IPC IPC(8): G01N21/63G01N21/01
CPCG01N21/01G01N21/636Y02E30/10
Inventor 张贞董斌薛曼白锐朋郭源刘鸣华
Owner INST OF CHEM CHINESE ACAD OF SCI
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